Integrated circuit and method for testing the integrated circuit (priority date 12-06-2001/international filing date 10-06-2002/international publication date 19-12-2002)

C.H. Berkel, van

Integrated circuit and method for testing the integrated circuit (priority date 12-06-2001/international filing date 10-06-2002/international publication date 19-12-2002)

Research output: Patent › Patent publication

Original language	English
Patent number	WO02101926
Publication status	Published - 19 Dec 2002

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@misc{3b36b87a5fa641dbbeb59adada341498,

title = "Integrated circuit and method for testing the integrated circuit (priority date 12-06-2001/international filing date 10-06-2002/international publication date 19-12-2002)",

author = "{Berkel, van}, C.H.",

year = "2002",

month = dec,

day = "19",

language = "English",

type = "Patent",

note = "WO02101926",

}

Integrated circuit and method for testing the integrated circuit (priority date 12-06-2001/international filing date 10-06-2002/international publication date 19-12-2002)

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