Influences on relaxation of exchange biasing in NiO/Ni66Co 18Fe16 bilayers

P.A.A. van der Heijden, T.F.M.M. Maas, J.C.S. Kools, F. Roozeboom, P.J. van der Zaag, W.J.M. de Jonge

Research output: Contribution to journalArticleAcademicpeer-review

33 Citations (Scopus)


The stability of the exchange biasing field, Heb has been studied for NiO/Ni66CO18Fe16 bilayers. A forced antiparallel alignment of the ferromagnetic magnetization to Heb results in a gradual decrease and even a reversal of Heb. The decrease of Heb increases with temperature and is independent of the external field and NiO layer thickness. This decrease can be interpreted by a thermally assisted relaxation process. A new effect of the relaxation process on Heb is demonstrated by using different cooling rates.

Original languageEnglish
Pages (from-to)7207-7209
Number of pages3
JournalJournal of Applied Physics
Issue number11
Publication statusPublished - 1 Jan 1998


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