Influences on relaxation of exchange biasing in NiO/Ni66Co 18Fe16 bilayers

P.A.A. van der Heijden; T.F.M.M. Maas; J.C.S. Kools; F. Roozeboom; P.J. van der Zaag; W.J.M. de Jonge

doi:10.1063/1.367549

Influences on relaxation of exchange biasing in NiO/Ni₆₆Co ₁₈Fe₁₆ bilayers

P.A.A. van der Heijden, T.F.M.M. Maas, J.C.S. Kools, F. Roozeboom, P.J. van der Zaag, W.J.M. de Jonge

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Abstract

The stability of the exchange biasing field, H_eb has been studied for NiO/Ni₆₆CO₁₈Fe₁₆ bilayers. A forced antiparallel alignment of the ferromagnetic magnetization to H_eb results in a gradual decrease and even a reversal of H_eb. The decrease of H_eb increases with temperature and is independent of the external field and NiO layer thickness. This decrease can be interpreted by a thermally assisted relaxation process. A new effect of the relaxation process on H_eb is demonstrated by using different cooling rates.

Original language	English
Pages (from-to)	7207-7209
Number of pages	3
Journal	Journal of Applied Physics
Volume	83
Issue number	11
DOIs	https://doi.org/10.1063/1.367549
Publication status	Published - 1 Jan 1998

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@article{96a99976c1da47198a53ca43928d8993,

title = "Influences on relaxation of exchange biasing in NiO/Ni66Co 18Fe16 bilayers",

abstract = "The stability of the exchange biasing field, Heb has been studied for NiO/Ni66CO18Fe16 bilayers. A forced antiparallel alignment of the ferromagnetic magnetization to Heb results in a gradual decrease and even a reversal of Heb. The decrease of Heb increases with temperature and is independent of the external field and NiO layer thickness. This decrease can be interpreted by a thermally assisted relaxation process. A new effect of the relaxation process on Heb is demonstrated by using different cooling rates.",

author = "\{van der Heijden\}, P.A.A. and T.F.M.M. Maas and J.C.S. Kools and F. Roozeboom and \{van der Zaag\}, P.J. and \{de Jonge\}, W.J.M.",

year = "1998",

month = jan,

day = "1",

doi = "10.1063/1.367549",

language = "English",

volume = "83",

pages = "7207--7209",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "11",

}

TY - JOUR

T1 - Influences on relaxation of exchange biasing in NiO/Ni66Co 18Fe16 bilayers

AU - van der Heijden, P.A.A.

AU - Maas, T.F.M.M.

AU - Kools, J.C.S.

AU - Roozeboom, F.

AU - van der Zaag, P.J.

AU - de Jonge, W.J.M.

PY - 1998/1/1

Y1 - 1998/1/1

N2 - The stability of the exchange biasing field, Heb has been studied for NiO/Ni66CO18Fe16 bilayers. A forced antiparallel alignment of the ferromagnetic magnetization to Heb results in a gradual decrease and even a reversal of Heb. The decrease of Heb increases with temperature and is independent of the external field and NiO layer thickness. This decrease can be interpreted by a thermally assisted relaxation process. A new effect of the relaxation process on Heb is demonstrated by using different cooling rates.

AB - The stability of the exchange biasing field, Heb has been studied for NiO/Ni66CO18Fe16 bilayers. A forced antiparallel alignment of the ferromagnetic magnetization to Heb results in a gradual decrease and even a reversal of Heb. The decrease of Heb increases with temperature and is independent of the external field and NiO layer thickness. This decrease can be interpreted by a thermally assisted relaxation process. A new effect of the relaxation process on Heb is demonstrated by using different cooling rates.

UR - http://www.scopus.com/inward/record.url?scp=0001753782&partnerID=8YFLogxK

U2 - 10.1063/1.367549

DO - 10.1063/1.367549

M3 - Article

AN - SCOPUS:0001753782

SN - 0021-8979

VL - 83

SP - 7207

EP - 7209

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 11

ER -

Influences on relaxation of exchange biasing in NiO/Ni₆₆Co ₁₈Fe₁₆ bilayers

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