Influence of substrate noise on RF performance

Domine Leenaerts, Peter de Vreede

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

13 Citations (Scopus)

Abstract

A low-ohmic substrate 0.25μm CMOS process has been chosen to carry out experiments to measure the effects of substrate noise on the performance of circuits operating at radio frequencies. Clock circuits give rise to substrate noise with spectral harmonics far into the RF band. These harmonics are injected into the signal path of RF circuitry as will be demonstrated. Clock planning is therefore a major issue in mixed-signal telecommunication.

Original languageEnglish
Title of host publicationESSCIRC‘2000
Subtitle of host publication26th European Solid-State Circuits Conference 19 – 21 September 2000 Stockholm, Sweden
PublisherInstitute of Electrical and Electronics Engineers
Pages328-331
Number of pages4
Publication statusPublished - 1 Aug 2005
Event26th European Solid-State Circuits Conference, ESSCIRC 2000 - Stockholm, Sweden
Duration: 19 Sept 200021 Sept 2000

Conference

Conference26th European Solid-State Circuits Conference, ESSCIRC 2000
Country/TerritorySweden
CityStockholm
Period19/09/0021/09/00

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