Influence of protection on transient stability of medium voltage grids including distributed generation

E.J. Coster, J.M.A. Myrzik, W.L. Kling

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

Due to the increase of distributed generation (DG) in the future it can become important to keep DG connected to the grid in order to maintain the balance between consumed and generated electrical power. Keeping DG-units connected to the grid during a disturbance, the dynamic behavior of the DG-units becomes important. Protection schemes based on definite and inverse over-current are simulated and transient stability of DG-units is investigated. The simulations have shown that there is no major benefit to apply inverse over-current relays in MV-grids with short feeder length and high short circuit power. With conventional grading of the protection in most cases the DG-units become unstable. The paper shows that reduction of the time grading is possible however, this reduction is not sufficient to guarantee stable operation. The best option is fast fault clearing of the complete feeder. It is shown that this is possible without loss of selectivity and with stable operation of the remaining DG-units.
Original languageEnglish
Title of host publicationProceedings of the 42nd International Universities Power Engineering Conference (UPEC 2007) 4-6 September 2007, Brighton, UK
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages1054-1059
ISBN (Print)978-1-4244-3689-7
DOIs
Publication statusPublished - 2007
Event42nd International Universities Power Engineering Conference (UPEC 2007) - University of Brighton, Brighton, UK, United Kingdom
Duration: 4 Sep 20076 Sep 2007

Conference

Conference42nd International Universities Power Engineering Conference (UPEC 2007)
Abbreviated titleUPEC 2007
CountryUnited Kingdom
CityBrighton, UK
Period4/09/076/09/07

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Distributed power generation
Electric potential
Short circuit currents

Cite this

Coster, E. J., Myrzik, J. M. A., & Kling, W. L. (2007). Influence of protection on transient stability of medium voltage grids including distributed generation. In Proceedings of the 42nd International Universities Power Engineering Conference (UPEC 2007) 4-6 September 2007, Brighton, UK (pp. 1054-1059). Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/UPEC.2007.4469096
Coster, E.J. ; Myrzik, J.M.A. ; Kling, W.L. / Influence of protection on transient stability of medium voltage grids including distributed generation. Proceedings of the 42nd International Universities Power Engineering Conference (UPEC 2007) 4-6 September 2007, Brighton, UK. Piscataway : Institute of Electrical and Electronics Engineers, 2007. pp. 1054-1059
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Coster, EJ, Myrzik, JMA & Kling, WL 2007, Influence of protection on transient stability of medium voltage grids including distributed generation. in Proceedings of the 42nd International Universities Power Engineering Conference (UPEC 2007) 4-6 September 2007, Brighton, UK. Institute of Electrical and Electronics Engineers, Piscataway, pp. 1054-1059, 42nd International Universities Power Engineering Conference (UPEC 2007), Brighton, UK, United Kingdom, 4/09/07. https://doi.org/10.1109/UPEC.2007.4469096

Influence of protection on transient stability of medium voltage grids including distributed generation. / Coster, E.J.; Myrzik, J.M.A.; Kling, W.L.

Proceedings of the 42nd International Universities Power Engineering Conference (UPEC 2007) 4-6 September 2007, Brighton, UK. Piscataway : Institute of Electrical and Electronics Engineers, 2007. p. 1054-1059.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Coster EJ, Myrzik JMA, Kling WL. Influence of protection on transient stability of medium voltage grids including distributed generation. In Proceedings of the 42nd International Universities Power Engineering Conference (UPEC 2007) 4-6 September 2007, Brighton, UK. Piscataway: Institute of Electrical and Electronics Engineers. 2007. p. 1054-1059 https://doi.org/10.1109/UPEC.2007.4469096