Influence of planar material size and position on shielding effectiveness measurements using the dual waveguide method

Evangelia Tourounoglou, Vasiliki Gkatsi, Anne Roc'h, Robert Vogt-Ardatjew, Hans Schipper, Frank Leferink

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

The dual waveguide method for shielding effectiveness measurements is a very effective and practical method, as it can provide reliable results quickly and in a wide frequency range. However, when it comes to planar materials, the size and position of the sample is critical. Different sizes and shapes of the sample need to be tested in order to determine the one that provides reliable results. Furthermore, the position of the sample along the waveguide, as well as its distance from the source, using different lengths of waveguides, need to be investigated. In this paper, these two parameters are studied in order to examine their effect on the results.

Original languageEnglish
Title of host publicationEMC Europe 2019 - 2019 International Symposium on Electromagnetic Compatibility
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages707-711
Number of pages5
ISBN (Electronic)978-1-7281-0594-9
DOIs
Publication statusPublished - 1 Sept 2019
Event2019 International Symposium on Electromagnetic Compatibility, EMC Europe 2019 - Barcelona, Spain
Duration: 2 Sept 20196 Sept 2019
http://2019 International Symposium on Electromagnetic Compatibility - EMC Europe

Conference

Conference2019 International Symposium on Electromagnetic Compatibility, EMC Europe 2019
Abbreviated titleEMC2019
Country/TerritorySpain
CityBarcelona
Period2/09/196/09/19
Internet address

Keywords

  • dual waveguide
  • L-band waveguide
  • shielding effectiveness
  • shielding effectiveness material
  • X-band waveguide

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