Influence of on-wafer probes in mm-wave antenna measurements

Q. Liu; A.C.F. Reniers; U. Johannsen; M.C. van Beurden; A.B. Smolders

doi:10.1049/cp.2018.0374

Influence of on-wafer probes in mm-wave antenna measurements

Q. Liu, A.C.F. Reniers, U. Johannsen, M.C. van Beurden, A.B. Smolders

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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Abstract

The influence of the use of on-wafer probes for mm-wave antenna-on-chip (AoC) measurements is investigated. On-wafer probes are widely used for analyzing integrated circuits. Although not specifically designed for this, on-wafer probes are also commonly used to characterize AoCs. The probe design provided a transition from coaxial cable to co-planar waveguide. As a test case, a monopole AoC is used to demonstrate several effects that influence an accurate calibration of the test set-up. It is shown that on-chip calibration is preferred and provides more accurate de-embedding of parasitic effects. In addition, it is shown that the polarization purity is seriously affected by the coupling between AoC and probe tip.

Original language	English
Title of host publication	12th European Conference on Antennas and Propagation, EuCAP 2018
Publisher	Institution of Engineering and Technology
Number of pages	5
ISBN (Electronic)	978-1-78561-816-1
ISBN (Print)	978-1-78561-815-4
DOIs	https://doi.org/10.1049/cp.2018.0374
Publication status	Published - 15 Apr 2018
Event	12th European Conference on Antennas and Propagation (EuCAP 2018) - London, United Kingdom Duration: 9 Apr 2018 → 13 Apr 2018 Conference number: 12 http://www.eucap2018.org/

Conference

Conference	12th European Conference on Antennas and Propagation (EuCAP 2018)
Abbreviated title	EuCAP 2018
Country/Territory	United Kingdom
City	London
Period	9/04/18 → 13/04/18
Internet address	http://www.eucap2018.org/

Keywords

Antenna-on-chip
De-embedding
On-wafer probe
Polarization

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10.1049/cp.2018.0374

Cite this

@inproceedings{59e41828bcc64ff29a87edf0d09f836f,

title = "Influence of on-wafer probes in mm-wave antenna measurements",

abstract = "The influence of the use of on-wafer probes for mm-wave antenna-on-chip (AoC) measurements is investigated. On-wafer probes are widely used for analyzing integrated circuits. Although not specifically designed for this, on-wafer probes are also commonly used to characterize AoCs. The probe design provided a transition from coaxial cable to co-planar waveguide. As a test case, a monopole AoC is used to demonstrate several effects that influence an accurate calibration of the test set-up. It is shown that on-chip calibration is preferred and provides more accurate de-embedding of parasitic effects. In addition, it is shown that the polarization purity is seriously affected by the coupling between AoC and probe tip.",

keywords = "Antenna-on-chip, De-embedding, On-wafer probe, Polarization",

author = "Q. Liu and A.C.F. Reniers and U. Johannsen and {van Beurden}, M.C. and A.B. Smolders",

year = "2018",

month = apr,

day = "15",

doi = "10.1049/cp.2018.0374",

language = "English",

isbn = "978-1-78561-815-4",

booktitle = "12th European Conference on Antennas and Propagation, EuCAP 2018",

publisher = "Institution of Engineering and Technology",

address = "United Kingdom",

note = "12th European Conference on Antennas and Propagation (EuCAP 2018), EuCAP 2018 ; Conference date: 09-04-2018 Through 13-04-2018",

url = "http://www.eucap2018.org/",

}

Liu, Q, Reniers, ACF , Johannsen, U , van Beurden, MC & Smolders, AB 2018, Influence of on-wafer probes in mm-wave antenna measurements. in 12th European Conference on Antennas and Propagation, EuCAP 2018., 8568052, Institution of Engineering and Technology, 12th European Conference on Antennas and Propagation (EuCAP 2018), London, United Kingdom, 9/04/18. https://doi.org/10.1049/cp.2018.0374

TY - GEN

T1 - Influence of on-wafer probes in mm-wave antenna measurements

AU - Liu, Q.

AU - Reniers, A.C.F.

AU - Johannsen, U.

AU - van Beurden, M.C.

AU - Smolders, A.B.

N1 - Conference code: 12

PY - 2018/4/15

Y1 - 2018/4/15

N2 - The influence of the use of on-wafer probes for mm-wave antenna-on-chip (AoC) measurements is investigated. On-wafer probes are widely used for analyzing integrated circuits. Although not specifically designed for this, on-wafer probes are also commonly used to characterize AoCs. The probe design provided a transition from coaxial cable to co-planar waveguide. As a test case, a monopole AoC is used to demonstrate several effects that influence an accurate calibration of the test set-up. It is shown that on-chip calibration is preferred and provides more accurate de-embedding of parasitic effects. In addition, it is shown that the polarization purity is seriously affected by the coupling between AoC and probe tip.

AB - The influence of the use of on-wafer probes for mm-wave antenna-on-chip (AoC) measurements is investigated. On-wafer probes are widely used for analyzing integrated circuits. Although not specifically designed for this, on-wafer probes are also commonly used to characterize AoCs. The probe design provided a transition from coaxial cable to co-planar waveguide. As a test case, a monopole AoC is used to demonstrate several effects that influence an accurate calibration of the test set-up. It is shown that on-chip calibration is preferred and provides more accurate de-embedding of parasitic effects. In addition, it is shown that the polarization purity is seriously affected by the coupling between AoC and probe tip.

KW - Antenna-on-chip

KW - De-embedding

KW - On-wafer probe

KW - Polarization

UR - http://www.scopus.com/inward/record.url?scp=85057330719&partnerID=8YFLogxK

U2 - 10.1049/cp.2018.0374

DO - 10.1049/cp.2018.0374

M3 - Conference contribution

SN - 978-1-78561-815-4

BT - 12th European Conference on Antennas and Propagation, EuCAP 2018

PB - Institution of Engineering and Technology

T2 - 12th European Conference on Antennas and Propagation (EuCAP 2018)

Y2 - 9 April 2018 through 13 April 2018

ER -

Influence of on-wafer probes in mm-wave antenna measurements

Abstract

Conference

Keywords

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