Influence of on-wafer probes in mm-wave antenna measurements

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

The influence of the use of on-wafer probes for mm-wave antenna-on-chip (AoC) measurements is investigated. On-wafer probes are widely used for analyzing integrated circuits. Although not specifically designed for this, on-wafer probes are also commonly used to characterize AoCs. The probe design provided a transition from coaxial cable to co-planar waveguide. As a test case, a monopole AoC is used to demonstrate several effects that influence an accurate calibration of the test set-up. It is shown that on-chip calibration is preferred and provides more accurate de-embedding of parasitic effects. In addition, it is shown that the polarization purity is seriously affected by the coupling between AoC and probe tip.

Original languageEnglish
Title of host publication 12th European Conference on Antennas and Propagation, EuCAP 2018
PublisherInstitution of Engineering and Technology (IET)
Number of pages5
ISBN (Electronic)978-1-78561-816-1
ISBN (Print)978-1-78561-815-4
DOIs
Publication statusPublished - 15 Apr 2018
Event12th European Conference on Antennas and Propagation, (EuCAP 2018) - London, United Kingdom
Duration: 9 Apr 201813 Apr 2018
Conference number: 12
http://www.eucap2018.org/

Conference

Conference12th European Conference on Antennas and Propagation, (EuCAP 2018)
Abbreviated titleEuCAP 2018
CountryUnited Kingdom
CityLondon
Period9/04/1813/04/18
Internet address

Keywords

  • Antenna-on-chip
  • De-embedding
  • On-wafer probe
  • Polarization

Fingerprint Dive into the research topics of 'Influence of on-wafer probes in mm-wave antenna measurements'. Together they form a unique fingerprint.

  • Cite this

    Liu, Q., Reniers, A. C. F., Johannsen, U., van Beurden, M. C., & Smolders, A. B. (2018). Influence of on-wafer probes in mm-wave antenna measurements. In 12th European Conference on Antennas and Propagation, EuCAP 2018 [8568052] Institution of Engineering and Technology (IET). https://doi.org/10.1049/cp.2018.0374