Abstract
The influence of the use of on-wafer probes for mm-wave antenna-on-chip (AoC) measurements is investigated. On-wafer probes are widely used for analyzing integrated circuits. Although not specifically designed for this, on-wafer probes are also commonly used to characterize AoCs. The probe design provided a transition from coaxial cable to co-planar waveguide. As a test case, a monopole AoC is used to demonstrate several effects that influence an accurate calibration of the test set-up. It is shown that on-chip calibration is preferred and provides more accurate de-embedding of parasitic effects. In addition, it is shown that the polarization purity is seriously affected by the coupling between AoC and probe tip.
| Original language | English |
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| Title of host publication | 12th European Conference on Antennas and Propagation, EuCAP 2018 |
| Publisher | Institution of Engineering and Technology (IET) |
| Number of pages | 5 |
| ISBN (Electronic) | 978-1-78561-816-1 |
| ISBN (Print) | 978-1-78561-815-4 |
| DOIs | |
| Publication status | Published - 15 Apr 2018 |
| Event | 12th European Conference on Antennas and Propagation (EuCAP 2018) - London, United Kingdom Duration: 9 Apr 2018 → 13 Apr 2018 Conference number: 12 http://www.eucap2018.org/ |
Conference
| Conference | 12th European Conference on Antennas and Propagation (EuCAP 2018) |
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| Abbreviated title | EuCAP 2018 |
| Country/Territory | United Kingdom |
| City | London |
| Period | 9/04/18 → 13/04/18 |
| Internet address |
Keywords
- Antenna-on-chip
- De-embedding
- On-wafer probe
- Polarization