We present a general model of noisy scattering parameter (S-parameter) measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise is examined to appear as a complex Gaussian quotient. The statistical analysis of the residual error is given and relevant statistical quantities are derived and discussed. Experiments were conducted on a two-port VNA to validate the noise influenced S-parameter model. We show that the uncertainty due to the noise is often critical in S-parameter measurements, in particular for S-parameters of a small magnitude.
|Number of pages||15|
|Journal||IEEE Transactions on Microwave Theory and Techniques|
|Publication status||Published - 1 Nov 2020|
- Network analysis
- Probability distribution
- Random variable
- Scattering parameter