Abstract
Influence of electrode structure on magneto transport in magnetic tunnel junctions was studied. Co/Al2O3/Co junctions were prepared with differently textured Co layers, by dc/rf magnetron sputtering on either FeMn- or Ta-buffer layers. A direct relation between physical and electronic electrode structures and the properties of magnetic tunnel junctions was found.
| Original language | English |
|---|---|
| Title of host publication | 2002 IEEE International Magnetics Conference (INTERMAG) |
| Place of Publication | Piscataway |
| Publisher | Institute of Electrical and Electronics Engineers |
| Number of pages | 1 |
| ISBN (Electronic) | 9780780373655 |
| ISBN (Print) | 0-7803-7365-0 |
| DOIs | |
| Publication status | Published - 1 Dec 2002 |
| Event | 2002 IEEE International Magnetics Conference, INTERMAG 2002 - Amsterdam, Netherlands Duration: 28 Apr 2002 → 2 May 2002 |
Conference
| Conference | 2002 IEEE International Magnetics Conference, INTERMAG 2002 |
|---|---|
| Country/Territory | Netherlands |
| City | Amsterdam |
| Period | 28/04/02 → 2/05/02 |
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