Influence of electrode and sample shape on the 1/f noise parameter fQ : a Schwarz-Christoffel analysis

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Abstract

Thin films for material characterization and noise tests are preferentially manufactured with rectangular electrode shapes. In the companying paper Vandamme presents expressions for resistance and geometrical noise factor fQ for the case of circular electrodes. The present paper employs numerical conformal mapping to obtain accurate values for rectangular and circular electrodes. The sample size is either assumed very large, or is taken comparable to the electrodes.
Original languageEnglish
Pages (from-to)485-495
Number of pages11
JournalFluctuation and Noise Letters
Volume10
Issue number4
DOIs
Publication statusPublished - 2011

Fingerprint

1/f Noise
Electrode
electrodes
Numerical Conformal Mapping
Noise Factor
Material Characterization
conformal mapping
Thin Films
Sample Size
Influence
thin films

Cite this

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title = "Influence of electrode and sample shape on the 1/f noise parameter fQ : a Schwarz-Christoffel analysis",
abstract = "Thin films for material characterization and noise tests are preferentially manufactured with rectangular electrode shapes. In the companying paper Vandamme presents expressions for resistance and geometrical noise factor fQ for the case of circular electrodes. The present paper employs numerical conformal mapping to obtain accurate values for rectangular and circular electrodes. The sample size is either assumed very large, or is taken comparable to the electrodes.",
author = "{Deursen, van}, A.P.J.",
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language = "English",
volume = "10",
pages = "485--495",
journal = "Fluctuation and Noise Letters",
issn = "0219-4775",
publisher = "World Scientific",
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}

Influence of electrode and sample shape on the 1/f noise parameter fQ : a Schwarz-Christoffel analysis. / Deursen, van, A.P.J.

In: Fluctuation and Noise Letters, Vol. 10, No. 4, 2011, p. 485-495.

Research output: Contribution to journalArticleAcademicpeer-review

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T1 - Influence of electrode and sample shape on the 1/f noise parameter fQ : a Schwarz-Christoffel analysis

AU - Deursen, van, A.P.J.

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AB - Thin films for material characterization and noise tests are preferentially manufactured with rectangular electrode shapes. In the companying paper Vandamme presents expressions for resistance and geometrical noise factor fQ for the case of circular electrodes. The present paper employs numerical conformal mapping to obtain accurate values for rectangular and circular electrodes. The sample size is either assumed very large, or is taken comparable to the electrodes.

U2 - 10.1142/S0219477511000697

DO - 10.1142/S0219477511000697

M3 - Article

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SP - 485

EP - 495

JO - Fluctuation and Noise Letters

JF - Fluctuation and Noise Letters

SN - 0219-4775

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