Abstract
Thin films for material characterization and noise tests are preferentially manufactured with rectangular electrode shapes. In the companying paper Vandamme presents expressions for resistance and geometrical noise factor fQ for the case of circular electrodes. The present paper employs numerical conformal mapping to obtain accurate values for rectangular and circular electrodes. The sample size is either assumed very large, or is taken comparable to the electrodes.
| Original language | English |
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| Pages (from-to) | 485-495 |
| Number of pages | 11 |
| Journal | Fluctuation and Noise Letters |
| Volume | 10 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2011 |