In situ surface analysis by low energy ion scattering

A.W. Denier van der Gon, H.M.R. Cortenraad, W.P.A. Jansen, M.A. Reijme, H.H. Brongersma

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Abstract

We discuss the possibilities to apply low energy ion scattering (LEIS) for in situ surface analysis of devices and functional materials. First we discuss the limitations imposed by the technique such as pressure and spatial resolution. Next, we present a new method to suppress backgrounds in LEIS spectra due to the presence of light elements by using a combined electrostatic and flight-time analysis. Examples of in situ analysis on thermionic cathodes are presented which shed light on the surface structure and composition of these cathodes, and also allow us to study the resistivity of such cathodes to ion bombardement. Finally, a design is presented for a pressure cell for in situ surface analysis of catalysts during catalytic reaction.
Original languageEnglish
Pages (from-to)56-64
Number of pages9
JournalNuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
Volume161-163
DOIs
Publication statusPublished - 2000

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