In situ optical probes of surface processes and interface formation during amorphous and epitaxial silicon thin film growth

W.M.M. Kessels, J.J.H. Gielis, P.J. Oever, van den, B. Hoex, I.M.P. Aarts, A.C.R. Pipino, M.C.M. Sanden, van de

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationICANS 22 - abstract book : 22nd international conference on amorphous and nanocrystalline semiconductors : August 19-24, 2007, Breckenridge, Colorado, USA
EditorsE.A. Schiff, B. Nelson, H.M. Branz
Publication statusPublished - 2007

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