In situ optical probes of surface processes and interface formation during amorphous and epitaxial silicon thin film growth

Research output: Contribution to conferenceOtherAcademic

Abstract

Abstract only.
Original languageEnglish
Number of pages1
Publication statusPublished - 2007
Event22nd International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 2007) - Breckenbridge, United States
Duration: 30 Sep 200730 Sep 2007
Conference number: 22

Conference

Conference22nd International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 2007)
Abbreviated titleICANS 2007
CountryUnited States
CityBreckenbridge
Period30/09/0730/09/07
Other22nd International Conference on Amorphous and Nanocrystalline Semiconductors

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