In Situ Manipulation and Micromechanical Characterization of Diatom Frustule Constituents Using Focused Ion Beam Scanning Electron Microscopy

Mohammad Soleimani, Lambèrt C.A. van Breemen, Sai P. Maddala, Rick R.M. Joosten, Hanglong Wu, Ingeborg Schreur-Piet, Rolf A.T.M. van Benthem (Corresponding author), Heiner Friedrich (Corresponding author)

Research output: Contribution to journal › Article › Academic › peer-review

6 Citations (Scopus)

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Center for Multiscale Electron Microscopy (CMEM)
Friedrich, H. (Manager), Joosten, R. (Education/research officer), Schmit, P. (Education/research officer), Schreur - Piet, I. (Other) & Spoelstra, A. (Education/research officer)
Physical Chemistry
Facility/equipment: Research lab