In-situ Lliquid phase electron microscopy of beam-sensitive materials

Hanglong Wu; Alessandro Ianiro; Mark M.J. van Rijt; A.C.C. (Catarina) Esteves; Remco Tuinier; Heiner Friedrich; Nico A.J.M. Sommerdijk; J.P. Patterson

doi:10.1017/S1431927618016045

In-situ Lliquid phase electron microscopy of beam-sensitive materials

Hanglong Wu
, Alessandro Ianiro
, Mark M.J. van Rijt
, A.C.C. (Catarina) Esteves
, Remco Tuinier
, Heiner Friedrich
, Nico A.J.M. Sommerdijk
, J.P. Patterson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy
Publisher	Cambridge University Press
Pages	66-64
Number of pages	2
DOIs	https://doi.org/10.1017/S1431927618016045
Publication status	Published - 7 Feb 2018
Event	4th Conference on In-Situ and Correlative Electron Microscopy - Saarbrücken, Germany Duration: 10 Oct 2018 → 12 Oct 2018

Publication series

Name	Microscopy and microanalysis
Number	1
Volume	25
ISSN (Print)	1431-9276
ISSN (Electronic)	1435-8115

Conference

Conference	4th Conference on In-Situ and Correlative Electron Microscopy
Country/Territory	Germany
City	Saarbrücken
Period	10/10/18 → 12/10/18

Access to Document

10.1017/S1431927618016045

Cite this

Wu, H., Ianiro, A., van Rijt, M. M. J., Esteves, A. C. C., Tuinier, R., Friedrich, H., Sommerdijk, N. A. J. M., & Patterson, J. P. (2018). In-situ Lliquid phase electron microscopy of beam-sensitive materials. In Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy (pp. 66-64). (Microscopy and microanalysis; Vol. 25, No. 1). Cambridge University Press. https://doi.org/10.1017/S1431927618016045

@inproceedings{cb487c0eca084014ba54a3bad62796a3,

title = "In-situ Lliquid phase electron microscopy of beam-sensitive materials",

author = "Hanglong Wu and Alessandro Ianiro and \{van Rijt\}, \{Mark M.J.\} and Esteves, \{A.C.C. (Catarina)\} and Remco Tuinier and Heiner Friedrich and Sommerdijk, \{Nico A.J.M.\} and J.P. Patterson",

year = "2018",

month = feb,

day = "7",

doi = "10.1017/S1431927618016045",

language = "English",

series = "Microscopy and microanalysis",

publisher = "Cambridge University Press",

number = "1",

pages = "66--64",

booktitle = "Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy",

address = "United Kingdom",

note = "4th Conference on In-Situ and Correlative Electron Microscopy ; Conference date: 10-10-2018 Through 12-10-2018",

}

Wu, H, Ianiro, A, van Rijt, MMJ, Esteves, ACC , Tuinier, R , Friedrich, H, Sommerdijk, NAJM & Patterson, JP 2018, In-situ Lliquid phase electron microscopy of beam-sensitive materials. in Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy. Microscopy and microanalysis, no. 1, vol. 25, Cambridge University Press, pp. 66-64, 4th Conference on In-Situ and Correlative Electron Microscopy, Saarbrücken, Germany, 10/10/18. https://doi.org/10.1017/S1431927618016045

In-situ Lliquid phase electron microscopy of beam-sensitive materials. / Wu, Hanglong; Ianiro, Alessandro; van Rijt, Mark M.J. et al.
Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy. Cambridge University Press, 2018. p. 66-64 (Microscopy and microanalysis; Vol. 25, No. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - In-situ Lliquid phase electron microscopy of beam-sensitive materials

AU - Wu, Hanglong

AU - Ianiro, Alessandro

AU - van Rijt, Mark M.J.

AU - Esteves, A.C.C. (Catarina)

AU - Tuinier, Remco

AU - Friedrich, Heiner

AU - Sommerdijk, Nico A.J.M.

AU - Patterson, J.P.

PY - 2018/2/7

Y1 - 2018/2/7

U2 - 10.1017/S1431927618016045

DO - 10.1017/S1431927618016045

M3 - Conference contribution

T3 - Microscopy and microanalysis

SP - 66

EP - 64

BT - Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy

PB - Cambridge University Press

T2 - 4th Conference on In-Situ and Correlative Electron Microscopy

Y2 - 10 October 2018 through 12 October 2018

ER -