In-situ Lliquid phase electron microscopy of beam-sensitive materials

Hanglong Wu, Alessandro Ianiro, Mark M.J. van Rijt, A.C.C. (Catarina) Esteves, Remco Tuinier, Heiner Friedrich, Nico A.J.M. Sommerdijk, J.P. Patterson

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy
PublisherCambridge University Press
Pages66-64
Number of pages2
Volume25
DOIs
Publication statusPublished - 7 Feb 2018
Event4th Conference on In-Situ and Correlative Electron Microscopy - Saarbrücken, Germany
Duration: 10 Oct 201812 Oct 2018

Conference

Conference4th Conference on In-Situ and Correlative Electron Microscopy
CountryGermany
CitySaarbrücken
Period10/10/1812/10/18

Cite this

Wu, H., Ianiro, A., van Rijt, M. M. J., Esteves, A. C. C. C., Tuinier, R., Friedrich, H., Sommerdijk, N. A. J. M., & Patterson, J. P. (2018). In-situ Lliquid phase electron microscopy of beam-sensitive materials. In Proceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy (Vol. 25, pp. 66-64). Cambridge University Press. https://doi.org/10.1017/S1431927618016045