In-situ Lliquid phase electron microscopy of beam-sensitive materials

Hanglong Wu, Alessandro Ianiro, Mark M.J. van Rijt, A.C.C. (Catarina) Esteves, Remco Tuinier, Heiner Friedrich, Nico A.J.M. Sommerdijk, J.P. Patterson

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of CISCEM 2018 - the 4th Conference on In-Situ and Correlative Electron Microscopy
PublisherCambridge University Press
Pages66-64
Number of pages2
DOIs
Publication statusPublished - 7 Feb 2018
Event4th Conference on In-Situ and Correlative Electron Microscopy - Saarbrücken, Germany
Duration: 10 Oct 201812 Oct 2018

Publication series

NameMicroscopy and microanalysis
Number1
Volume25
ISSN (Print)1431-9276
ISSN (Electronic)1435-8115

Conference

Conference4th Conference on In-Situ and Correlative Electron Microscopy
CountryGermany
CitySaarbrücken
Period10/10/1812/10/18

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