In-plane anomalies of the exchange bias field in Ni80Fe20/Fe50Mn50 bilayers on Cu(110)

S. Rieding, M. Bauer, C. Mathieu, B. Hillebrands, R. Jungblut, J.T. Kohlhepp, A. Reinders

Research output: Contribution to journalArticleAcademicpeer-review

19 Citations (Scopus)
66 Downloads (Pure)

Abstract

We report on the exchange bias effect as a function of the in-plane direction of the applied field in twofold symmetric, epitaxial Ni80Fe20/Fe50Mn50 bilayers grown on Cu(110) single-crystal substrates. An enhancement of the exchange bias field, Heb, up to a factor of 2 is observed if the external field is nearly, but not fully aligned perpendicular to the symmetry direction of the exchange bias field. From the measurement of the exchange bias field as a function of the in-plane angle of the applied field, the unidirectional, uniaxial and fourfold anisotropy contributions are determined with high precision. The symmetry direction of the unidirectional anisotropy switches with increasing NiFe thickness from [110] to [001].
Original languageEnglish
Pages (from-to)6648-6651
Number of pages4
JournalJournal of Applied Physics
Volume85
Issue number9
DOIs
Publication statusPublished - 1999

Fingerprint Dive into the research topics of 'In-plane anomalies of the exchange bias field in Ni80Fe20/Fe50Mn50 bilayers on Cu(110)'. Together they form a unique fingerprint.

  • Cite this

    Rieding, S., Bauer, M., Mathieu, C., Hillebrands, B., Jungblut, R., Kohlhepp, J. T., & Reinders, A. (1999). In-plane anomalies of the exchange bias field in Ni80Fe20/Fe50Mn50 bilayers on Cu(110). Journal of Applied Physics, 85(9), 6648-6651. https://doi.org/10.1063/1.370174