Abstract
The anisotropic magnetoresistance (AMR) has been measured for Ni80Fe20 thin films, with the magnetization vector rotating in the film plane as well as out of the film plane. The out-of-plane (OF) AMR is found to be considerably larger than the in-plane (IF) effect, and strongly dependent on the degree of texture. In untextured films, the difference between the IP- and the OP-AMR is explained in terms of a dimensionality effect, whereas in (111)-textured films an additional contribution to the OP-AMR is found.
Original language | English |
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Pages (from-to) | 362-366 |
Number of pages | 5 |
Journal | Physical Review B: Condensed Matter |
Volume | 56 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1997 |