In-depth profiling with the electron probe microanalyzer

  • G.F. Bastin
  • , J.M. Dijkstra
  • , H.J.M. Heijligers
  • , D. Klepper

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationElectron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain
EditorsX. Llovet, C. Merlet, F. Salvat
Place of PublicationBarcelona, Spain
PublisherUniversitat de Barcelona
Pages25-55
Publication statusPublished - 1998

Cite this