| Original language | English |
|---|---|
| Title of host publication | Electron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain |
| Editors | X. Llovet, C. Merlet, F. Salvat |
| Place of Publication | Barcelona, Spain |
| Publisher | Universitat de Barcelona |
| Pages | 25-55 |
| Publication status | Published - 1998 |
In-depth profiling with the electron probe microanalyzer
- G.F. Bastin
- , J.M. Dijkstra
- , H.J.M. Heijligers
- , D. Klepper
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic