In-depth profiling with the electron probe microanalyzer

G.F. Bastin, J.M. Dijkstra, H.J.M. Heijligers, D. Klepper

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationElectron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain
EditorsX. Llovet, C. Merlet, F. Salvat
Place of PublicationBarcelona, Spain
PublisherUniversitat de Barcelona
Pages25-55
Publication statusPublished - 1998

Cite this

Bastin, G. F., Dijkstra, J. M., Heijligers, H. J. M., & Klepper, D. (1998). In-depth profiling with the electron probe microanalyzer. In X. Llovet, C. Merlet, & F. Salvat (Eds.), Electron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain (pp. 25-55). Barcelona, Spain: Universitat de Barcelona.