In-depth profiling with the electron probe microanalyzer

G.F. Bastin, J.M. Dijkstra, H.J.M. Heijligers, D. Klepper

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationElectron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain
EditorsX. Llovet, C. Merlet, F. Salvat
Place of PublicationBarcelona, Spain
PublisherUniversitat de Barcelona
Publication statusPublished - 1998

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