In-depth profiling with the electron probe microanalyzer

G.F. Bastin; J.M. Dijkstra; H.J.M. Heijligers; D. Klepper

In-depth profiling with the electron probe microanalyzer

G.F. Bastin, J.M. Dijkstra, H.J.M. Heijligers, D. Klepper

Materials and Interface Chemistry

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Original language	English
Title of host publication	Electron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain
Editors	X. Llovet, C. Merlet, F. Salvat
Place of Publication	Barcelona, Spain
Publisher	Universitat de Barcelona
Pages	25-55
Publication status	Published - 1998

Cite this

Bastin, G. F., Dijkstra, J. M., Heijligers, H. J. M., & Klepper, D. (1998). In-depth profiling with the electron probe microanalyzer. In X. Llovet, C. Merlet, & F. Salvat (Eds.), Electron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain (pp. 25-55). Barcelona, Spain: Universitat de Barcelona.

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title = "In-depth profiling with the electron probe microanalyzer",

author = "G.F. Bastin and J.M. Dijkstra and H.J.M. Heijligers and D. Klepper",

year = "1998",

language = "English",

pages = "25--55",

editor = "X. Llovet and C. Merlet and F. Salvat",

booktitle = "Electron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain",

publisher = "Universitat de Barcelona",

}

In-depth profiling with the electron probe microanalyzer. / Bastin, G.F.; Dijkstra, J.M.; Heijligers, H.J.M.; Klepper, D.

Electron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain. ed. / X. Llovet; C. Merlet; F. Salvat. Barcelona, Spain : Universitat de Barcelona, 1998. p. 25-55.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - In-depth profiling with the electron probe microanalyzer

AU - Bastin, G.F.

AU - Dijkstra, J.M.

AU - Heijligers, H.J.M.

AU - Klepper, D.

PY - 1998

Y1 - 1998

M3 - Conference contribution

SP - 25

EP - 55

BT - Electron probe microanalysis today : practical aspects : proceedings of EMAS'98, 3rd Regional Workshop : 13-16 May 1998, Barcelona, Spain

A2 - Llovet, X.

A2 - Merlet, C.

A2 - Salvat, F.

PB - Universitat de Barcelona

CY - Barcelona, Spain

ER -