In-depth profiling with electron-probe microanalyzer

G.F. Bastin, J.M. Dijkstra, H.J.M. Heijligers

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic


No abstract.
Original languageEnglish
Title of host publicationProceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada
EditorsG.J. Bailey, J. Bentley, J.A. Small
Place of PublicationSan Francisco
PublisherSan Francisco Press
Publication statusPublished - 1992


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