In-depth profiling with electron-probe microanalyzer

G.F. Bastin; J.M. Dijkstra; H.J.M. Heijligers

In-depth profiling with electron-probe microanalyzer

G.F. Bastin, J.M. Dijkstra, H.J.M. Heijligers

Materials and Interface Chemistry

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Abstract

No abstract.

Original language	English
Title of host publication	Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada
Editors	G.J. Bailey, J. Bentley, J.A. Small
Place of Publication	San Francisco
Publisher	San Francisco Press
Pages	1648-1649
Publication status	Published - 1992

Cite this

Bastin, G. F., Dijkstra, J. M., & Heijligers, H. J. M. (1992). In-depth profiling with electron-probe microanalyzer. In G. J. Bailey, J. Bentley, & J. A. Small (Eds.), Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada (pp. 1648-1649). San Francisco Press.

Bastin, G.F. ; Dijkstra, J.M. ; Heijligers, H.J.M. / In-depth profiling with electron-probe microanalyzer. Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada. editor / G.J. Bailey ; J. Bentley ; J.A. Small. San Francisco : San Francisco Press, 1992. pp. 1648-1649

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title = "In-depth profiling with electron-probe microanalyzer",

abstract = "No abstract.",

author = "G.F. Bastin and J.M. Dijkstra and H.J.M. Heijligers",

year = "1992",

language = "English",

pages = "1648--1649",

editor = "G.J. Bailey and J. Bentley and J.A. Small",

booktitle = "Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Soci{\'e}t{\'e} de Microscopie du Canada",

publisher = "San Francisco Press",

}

Bastin, GF, Dijkstra, JM & Heijligers, HJM 1992, In-depth profiling with electron-probe microanalyzer. in GJ Bailey, J Bentley & JA Small (eds), Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada. San Francisco Press, San Francisco, pp. 1648-1649.

In-depth profiling with electron-probe microanalyzer. / Bastin, G.F.; Dijkstra, J.M.; Heijligers, H.J.M.
Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada. ed. / G.J. Bailey; J. Bentley; J.A. Small. San Francisco: San Francisco Press, 1992. p. 1648-1649.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - In-depth profiling with electron-probe microanalyzer

AU - Bastin, G.F.

AU - Dijkstra, J.M.

AU - Heijligers, H.J.M.

PY - 1992

Y1 - 1992

N2 - No abstract.

AB - No abstract.

M3 - Conference contribution

SP - 1648

EP - 1649

BT - Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada

A2 - Bailey, G.J.

A2 - Bentley, J.

A2 - Small, J.A.

PB - San Francisco Press

CY - San Francisco

ER -

Bastin GF, Dijkstra JM, Heijligers HJM. In-depth profiling with electron-probe microanalyzer. In Bailey GJ, Bentley J, Small JA, editors, Proceedings of the 50th Annual Meeting of the Electron Microscopy Society of America held jointly with the 27th Annual Meeting of the Microbeam Analysis Society and the 19th Annual Meeting of the Microscopical Society of Canada/Société de Microscopie du Canada. San Francisco: San Francisco Press. 1992. p. 1648-1649

In-depth profiling with electron-probe microanalyzer

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