Improved thermally stable surface and bulk passivation of PECVD SiN X:H using N2 and SiH4

A.W. Weeber, H. C. Rieffe, M. J.A.A. Goris, J. Hong, W. M.M. Kessels, M. C.M. van de Sanden, W. J. Soppe

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)
2 Downloads (Pure)

Abstract

Excellent and thermally stable surface passivation of SiNx:H grown using N2 and SiH4 as precursor gases has been obtained with MicroWave PECVD. The thermal stability of the surface passivation is even better than that for layers deposited with NH3 and SiH 4. Additionally, we found that the bulk passivating properties of SiNx:H deposited with N2+SiH4 are as good as that of the standard SiNx:H deposited with NH3+SiH 4. Absorption at shorter wavelengths in SiNx:H layers deposited with N2+SiH4 is somewhat higher. Solar cell efficiencies are comparable for both nitrides.

Original languageEnglish
Title of host publicationProceedings of the 3rd World Conference on Photovoltaic Energy Conversion
EditorsK. Kurokawa, L.L. Kazmerski, B. McNeils, M. Yamaguchi, C. Wronski
PublisherArisumi Printing Inc
Pages1131-1134
Number of pages4
VolumeB
ISBN (Print)4990181603, 9784990181604
DOIs
Publication statusPublished - 1 Dec 2003
Event3rd World Conference on Photovoltaic Energy Conversion - Osaka, Japan
Duration: 11 May 200318 May 2003

Conference

Conference3rd World Conference on Photovoltaic Energy Conversion
Country/TerritoryJapan
CityOsaka
Period11/05/0318/05/03

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