Abstract
Excellent and thermally stable surface passivation of SiNx:H grown using N2 and SiH4 as precursor gases has been obtained with MicroWave PECVD. The thermal stability of the surface passivation is even better than that for layers deposited with NH3 and SiH 4. Additionally, we found that the bulk passivating properties of SiNx:H deposited with N2+SiH4 are as good as that of the standard SiNx:H deposited with NH3+SiH 4. Absorption at shorter wavelengths in SiNx:H layers deposited with N2+SiH4 is somewhat higher. Solar cell efficiencies are comparable for both nitrides.
Original language | English |
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Title of host publication | Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion |
Editors | K. Kurokawa, L.L. Kazmerski, B. McNeils, M. Yamaguchi, C. Wronski |
Publisher | Arisumi Printing Inc |
Pages | 1131-1134 |
Number of pages | 4 |
Volume | B |
ISBN (Print) | 4990181603, 9784990181604 |
DOIs | |
Publication status | Published - 1 Dec 2003 |
Event | 3rd World Conference on Photovoltaic Energy Conversion - Osaka, Japan Duration: 11 May 2003 → 18 May 2003 |
Conference
Conference | 3rd World Conference on Photovoltaic Energy Conversion |
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Country/Territory | Japan |
City | Osaka |
Period | 11/05/03 → 18/05/03 |