Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors

S.P.O. Bruce; L.K.J. Vandamme; A. Rydberg

doi:10.1109/16.861592

Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors

S.P.O. Bruce, L.K.J. Vandamme, A. Rydberg

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8 Citations (Scopus)

Abstract

A method is presented to improve accuracy in low-frequency noise characterization of bipolar transistors by using both a voltage amplifier and transimpedance amplifiers

Original language	English
Pages (from-to)	1772-1773
Number of pages	2
Journal	IEEE Transactions on Electron Devices
Volume	47
Issue number	9
DOIs	https://doi.org/10.1109/16.861592
Publication status	Published - 2000

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title = "Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors",

abstract = "A method is presented to improve accuracy in low-frequency noise characterization of bipolar transistors by using both a voltage amplifier and transimpedance amplifiers",

author = "S.P.O. Bruce and L.K.J. Vandamme and A. Rydberg",

year = "2000",

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AU - Bruce, S.P.O.

AU - Vandamme, L.K.J.

AU - Rydberg, A.

PY - 2000

Y1 - 2000

N2 - A method is presented to improve accuracy in low-frequency noise characterization of bipolar transistors by using both a voltage amplifier and transimpedance amplifiers

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DO - 10.1109/16.861592

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JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 9

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Improved correlation measurements using voltage and transimpedance amplifiers in low-frequency noise characterization of bipolar transistors

Abstract

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