Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield

T.S. Doorn, E.J.W. Maten, ter, J.A. Croon, A. Di Bucchianico, O. Wittich

Research output: Book/Report › Report › Academic

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Original language	English
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Number of pages	4
Publication status	Published - 2008

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title = "Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield",

author = "T.S. Doorn and \{Maten, ter\}, E.J.W. and J.A. Croon and \{Di Bucchianico\}, A. and O. Wittich",

year = "2008",

language = "English",

series = "CASA-report",

publisher = "Technische Universiteit Eindhoven",

}

TY - BOOK

T1 - Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield

AU - Doorn, T.S.

AU - Maten, ter, E.J.W.

AU - Croon, J.A.

AU - Di Bucchianico, A.

AU - Wittich, O.

PY - 2008

Y1 - 2008

M3 - Report

T3 - CASA-report

BT - Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -