Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield

T.S. Doorn, E.J.W. Maten, ter, J.A. Croon, A. Di Bucchianico, O. Wittich

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

65 Citations (Scopus)
1 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield'. Together they form a unique fingerprint.

Earth & Environmental Sciences