Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield

T.S. Doorn, E.J.W. Maten, ter, J.A. Croon, A. Di Bucchianico, O. Wittich

Research output: Book/ReportReportAcademic

57 Citations (Scopus)
152 Downloads (Pure)
Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages4
Publication statusPublished - 2008

Publication series

NameCASA-report
Volume0825
ISSN (Print)0926-4507

Cite this

Doorn, T. S., Maten, ter, E. J. W., Croon, J. A., Di Bucchianico, A., & Wittich, O. (2008). Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield. (CASA-report; Vol. 0825). Technische Universiteit Eindhoven.