Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield

T.S. Doorn, E.J.W. Maten, ter, J.A. Croon, A. Di Bucchianico, O. Wittich

Research output: Book/ReportReportAcademic

67 Citations (Scopus)
234 Downloads (Pure)
Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages4
Publication statusPublished - 2008

Publication series

ISSN (Print)0926-4507

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