Importance of high pressure, surface sensitive in situ methods: A study of ammonia oxidation over copper with in situ NEXAFS in the soft X-ray range

R.W. Mayer, M. Havecker, A. Knop-Gericke, L. Gang, B.G. Anderson, R.A. Santen, van, R. Schlögl

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Original languageEnglish
Title of host publicationAbstracts of papers, 219th ACS national meeting : San Francisco, CA, March 26 - 30, 2000
Pages80-
Publication statusPublished - 2000

Publication series

NameAbstracts of Papers of the American Chemical Society
Volume220
ISSN (Print)0065-7727

Cite this

Mayer, R. W., Havecker, M., Knop-Gericke, A., Gang, L., Anderson, B. G., Santen, van, R. A., & Schlögl, R. (2000). Importance of high pressure, surface sensitive in situ methods: A study of ammonia oxidation over copper with in situ NEXAFS in the soft X-ray range. In Abstracts of papers, 219th ACS national meeting : San Francisco, CA, March 26 - 30, 2000 (pp. 80-). (Abstracts of Papers of the American Chemical Society; Vol. 220).
Mayer, R.W. ; Havecker, M. ; Knop-Gericke, A. ; Gang, L. ; Anderson, B.G. ; Santen, van, R.A. ; Schlögl, R. / Importance of high pressure, surface sensitive in situ methods: A study of ammonia oxidation over copper with in situ NEXAFS in the soft X-ray range. Abstracts of papers, 219th ACS national meeting : San Francisco, CA, March 26 - 30, 2000. 2000. pp. 80- (Abstracts of Papers of the American Chemical Society).
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title = "Importance of high pressure, surface sensitive in situ methods: A study of ammonia oxidation over copper with in situ NEXAFS in the soft X-ray range",
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Mayer, RW, Havecker, M, Knop-Gericke, A, Gang, L, Anderson, BG, Santen, van, RA & Schlögl, R 2000, Importance of high pressure, surface sensitive in situ methods: A study of ammonia oxidation over copper with in situ NEXAFS in the soft X-ray range. in Abstracts of papers, 219th ACS national meeting : San Francisco, CA, March 26 - 30, 2000. Abstracts of Papers of the American Chemical Society, vol. 220, pp. 80-.

Importance of high pressure, surface sensitive in situ methods: A study of ammonia oxidation over copper with in situ NEXAFS in the soft X-ray range. / Mayer, R.W.; Havecker, M.; Knop-Gericke, A.; Gang, L.; Anderson, B.G.; Santen, van, R.A.; Schlögl, R.

Abstracts of papers, 219th ACS national meeting : San Francisco, CA, March 26 - 30, 2000. 2000. p. 80- (Abstracts of Papers of the American Chemical Society; Vol. 220).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

TY - GEN

T1 - Importance of high pressure, surface sensitive in situ methods: A study of ammonia oxidation over copper with in situ NEXAFS in the soft X-ray range

AU - Mayer, R.W.

AU - Havecker, M.

AU - Knop-Gericke, A.

AU - Gang, L.

AU - Anderson, B.G.

AU - Santen, van, R.A.

AU - Schlögl, R.

PY - 2000

Y1 - 2000

M3 - Conference contribution

T3 - Abstracts of Papers of the American Chemical Society

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BT - Abstracts of papers, 219th ACS national meeting : San Francisco, CA, March 26 - 30, 2000

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Mayer RW, Havecker M, Knop-Gericke A, Gang L, Anderson BG, Santen, van RA et al. Importance of high pressure, surface sensitive in situ methods: A study of ammonia oxidation over copper with in situ NEXAFS in the soft X-ray range. In Abstracts of papers, 219th ACS national meeting : San Francisco, CA, March 26 - 30, 2000. 2000. p. 80-. (Abstracts of Papers of the American Chemical Society).