Implementation and evaluation of a combined test-error correction procedure for memories with defects

A.J. Vinck, J. Pineda de Gyvez, K.A. Post

Research output: Book/Report › Report › Academic

38 Downloads (Pure)

Original language	English
Place of Publication	Eindhoven
Publisher	Technische Universiteit Eindhoven
Number of pages	22
Publication status	Published - 1987

Name	EUT report. E, Fac. of Electrical Engineering
Volume	87-E-169
ISSN (Print)	0929-8533

Access to Document

@book{3c481fc4ed7b4b0697ed7de5173bf29e,

title = "Implementation and evaluation of a combined test-error correction procedure for memories with defects",

author = "A.J. Vinck and {Pineda de Gyvez}, J. and K.A. Post",

year = "1987",

language = "English",

series = "EUT report. E, Fac. of Electrical Engineering",

publisher = "Technische Universiteit Eindhoven",

}

TY - BOOK

T1 - Implementation and evaluation of a combined test-error correction procedure for memories with defects

AU - Vinck, A.J.

AU - Pineda de Gyvez, J.

AU - Post, K.A.

PY - 1987

Y1 - 1987

M3 - Report

T3 - EUT report. E, Fac. of Electrical Engineering

BT - Implementation and evaluation of a combined test-error correction procedure for memories with defects

PB - Technische Universiteit Eindhoven

CY - Eindhoven

ER -