Implementation and evaluation of a combined test-error correction procedure for memories with defects

A.J. Vinck, J. Pineda de Gyvez, K.A. Post

Research output: Book/ReportReportAcademic

32 Downloads (Pure)
Original languageEnglish
Place of PublicationEindhoven
PublisherTechnische Universiteit Eindhoven
Number of pages22
Publication statusPublished - 1987

Publication series

NameEUT report. E, Fac. of Electrical Engineering
Volume87-E-169
ISSN (Print)0929-8533

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