Impact of silicon substrates, iron contamination and perimeter on saturation current and 1/f noise in n+p diodes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proc. 2nd ELEN Workshop
Pages	50201-50216
Publication status	Published - 1995
Event	2nd ELEN Workshop - Grenoble, France Duration: 25 Oct 1995 → 27 Oct 1995

Conference	2nd ELEN Workshop
Country/Territory	France
City	Grenoble
Period	25/10/95 → 27/10/95
Other	2nd ELEN Workshop, Grenoble, France, October 1995

Cite this

@inproceedings{cd119b08b2d34d438d580d53d6a142d8,

title = "Impact of silicon substrates, iron contamination and perimeter on saturation current and 1/f noise in n+p diodes",

author = "L.K.J. Vandamme and E.P. Vandamme",

year = "1995",

language = "English",

pages = "50201--50216",

booktitle = "Proc. 2nd ELEN Workshop",

note = "2nd ELEN Workshop ; Conference date: 25-10-1995 Through 27-10-1995",

}