Impact of silicon substrates, iron contamination and perimeter on saturation current and 1/f noise in n+p diodes

L.K.J. Vandamme, E.P. Vandamme

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProc. 2nd ELEN Workshop
Pages50201-50216
Publication statusPublished - 1995
Event2nd ELEN Workshop - Grenoble, France
Duration: 25 Oct 199527 Oct 1995

Conference

Conference2nd ELEN Workshop
CountryFrance
CityGrenoble
Period25/10/9527/10/95
Other2nd ELEN Workshop, Grenoble, France, October 1995

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