Impact of GHz disturbances on DC parametric measurements

H.P. Tuinhout, P.G.M. Baltus

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
43 Downloads (Pure)

Abstract

RF signals from mobile phones or WLAN transmitters can affect DC parametric measurements. A transistor test structure inside a wafer prober can behave as a GHz receiver when the needles or the manipulators that probe these transistors pick up sufficiently strong GHz signals. This paper shows examples of such occurrences and presents a technique for assessing the vulnerability of parametric measurement systems for GHz signals.
Original languageEnglish
Title of host publicationProceedings of the IEEE International Conference on Microelectronics Test Structures, 2006, ICMTS 2006, 6-9 March 2006, Austin, Texas
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages71-75
ISBN (Print)1-4244-0167-4
DOIs
Publication statusPublished - 2006
Eventconference; International Conference on Microelectronics Test Structures, March 2006 -
Duration: 1 Jan 2006 → …

Conference

Conferenceconference; International Conference on Microelectronics Test Structures, March 2006
Period1/01/06 → …
OtherInternational Conference on Microelectronics Test Structures, March 2006

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  • Cite this

    Tuinhout, H. P., & Baltus, P. G. M. (2006). Impact of GHz disturbances on DC parametric measurements. In Proceedings of the IEEE International Conference on Microelectronics Test Structures, 2006, ICMTS 2006, 6-9 March 2006, Austin, Texas (pp. 71-75). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ICMTS.2006.1614278