Impact of GHz disturbances on DC parametric measurements

H.P. Tuinhout; P.G.M. Baltus

doi:10.1109/ICMTS.2006.1614278

Impact of GHz disturbances on DC parametric measurements

H.P. Tuinhout, P.G.M. Baltus

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

84 Downloads (Pure)

Abstract

RF signals from mobile phones or WLAN transmitters can affect DC parametric measurements. A transistor test structure inside a wafer prober can behave as a GHz receiver when the needles or the manipulators that probe these transistors pick up sufficiently strong GHz signals. This paper shows examples of such occurrences and presents a technique for assessing the vulnerability of parametric measurement systems for GHz signals.

Original language	English
Title of host publication	Proceedings of the IEEE International Conference on Microelectronics Test Structures, 2006, ICMTS 2006, 6-9 March 2006, Austin, Texas
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	71-75
ISBN (Print)	1-4244-0167-4
DOIs	https://doi.org/10.1109/ICMTS.2006.1614278
Publication status	Published - 2006
Event	conference; International Conference on Microelectronics Test Structures, March 2006 - Duration: 1 Jan 2006 → …

Conference

Conference	conference; International Conference on Microelectronics Test Structures, March 2006
Period	1/01/06 → …
Other	International Conference on Microelectronics Test Structures, March 2006

Access to Document

10.1109/ICMTS.2006.1614278

Metis249104Final published version, 2.51 MB

Cite this

@inproceedings{45663dc3a9014794868a0943102ebcd1,

title = "Impact of GHz disturbances on DC parametric measurements",

abstract = "RF signals from mobile phones or WLAN transmitters can affect DC parametric measurements. A transistor test structure inside a wafer prober can behave as a GHz receiver when the needles or the manipulators that probe these transistors pick up sufficiently strong GHz signals. This paper shows examples of such occurrences and presents a technique for assessing the vulnerability of parametric measurement systems for GHz signals.",

author = "H.P. Tuinhout and P.G.M. Baltus",

year = "2006",

doi = "10.1109/ICMTS.2006.1614278",

language = "English",

isbn = "1-4244-0167-4",

pages = "71--75",

booktitle = "Proceedings of the IEEE International Conference on Microelectronics Test Structures, 2006, ICMTS 2006, 6-9 March 2006, Austin, Texas",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "conference; International Conference on Microelectronics Test Structures, March 2006 ; Conference date: 01-01-2006",

}

Tuinhout, HP & Baltus, PGM 2006, Impact of GHz disturbances on DC parametric measurements. in Proceedings of the IEEE International Conference on Microelectronics Test Structures, 2006, ICMTS 2006, 6-9 March 2006, Austin, Texas. Institute of Electrical and Electronics Engineers, Piscataway, pp. 71-75, conference; International Conference on Microelectronics Test Structures, March 2006, 1/01/06. https://doi.org/10.1109/ICMTS.2006.1614278

Impact of GHz disturbances on DC parametric measurements. / Tuinhout, H.P.; Baltus, P.G.M.
Proceedings of the IEEE International Conference on Microelectronics Test Structures, 2006, ICMTS 2006, 6-9 March 2006, Austin, Texas. Piscataway: Institute of Electrical and Electronics Engineers, 2006. p. 71-75.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Impact of GHz disturbances on DC parametric measurements

AU - Tuinhout, H.P.

AU - Baltus, P.G.M.

PY - 2006

Y1 - 2006

N2 - RF signals from mobile phones or WLAN transmitters can affect DC parametric measurements. A transistor test structure inside a wafer prober can behave as a GHz receiver when the needles or the manipulators that probe these transistors pick up sufficiently strong GHz signals. This paper shows examples of such occurrences and presents a technique for assessing the vulnerability of parametric measurement systems for GHz signals.

AB - RF signals from mobile phones or WLAN transmitters can affect DC parametric measurements. A transistor test structure inside a wafer prober can behave as a GHz receiver when the needles or the manipulators that probe these transistors pick up sufficiently strong GHz signals. This paper shows examples of such occurrences and presents a technique for assessing the vulnerability of parametric measurement systems for GHz signals.

U2 - 10.1109/ICMTS.2006.1614278

DO - 10.1109/ICMTS.2006.1614278

M3 - Conference contribution

SN - 1-4244-0167-4

SP - 71

EP - 75

BT - Proceedings of the IEEE International Conference on Microelectronics Test Structures, 2006, ICMTS 2006, 6-9 March 2006, Austin, Texas

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - conference; International Conference on Microelectronics Test Structures, March 2006

Y2 - 1 January 2006

ER -

Impact of GHz disturbances on DC parametric measurements

Abstract

Conference

Access to Document

Fingerprint

Cite this