Impact of amplifier bandwidth limitations on gain-boosted N-path receivers

D. Mitra, D. Milosevic, L.J. Breems, Jan van Sinderen, Salvatore Drago

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Abstract

The bandwidth of the RF amplifier severely limits the use of gain-boosted N-path receivers at high frequencies. Apart from limitation on the achievable impedance matching, the noise figure degradation severely handicaps the performance of the receiver. This paper describes a linear periodically time-variant (LPTV) analysis of the gain-boosted N-path receiver taking the amplifier bandwidth into consideration. By using the proposed analysis, the gain-boosted N-path receiver performance degradations are quantified and explained.
Original languageEnglish
Title of host publication2017 IEEE International Symposium on Circuits and Systems (ISCAS)
Subtitle of host publicationFrom Dreams to Innovation, ISCAS 2017 - Conference Proceedings
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Number of pages4
ISBN (Electronic)978-1-4673-6853-7
ISBN (Print)978-1-5090-1427-9
DOIs
Publication statusPublished - 28 Sep 2017
Event50th IEEE International Symposium on Circuits and Systems (ISCAS 2017) - Baltimore, United States
Duration: 28 May 201731 May 2017

Conference

Conference50th IEEE International Symposium on Circuits and Systems (ISCAS 2017)
Abbreviated titleISCAS 2017
CountryUnited States
CityBaltimore
Period28/05/1731/05/17

    Fingerprint

Keywords

  • Radio frequency
  • noise figure
  • linear periodically time-variant (LPTV)
  • passive mixer
  • Impedance matching
  • radio receivers
  • impedance matching

Cite this

Mitra, D., Milosevic, D., Breems, L. J., Sinderen, J. V., & Drago, S. (2017). Impact of amplifier bandwidth limitations on gain-boosted N-path receivers. In 2017 IEEE International Symposium on Circuits and Systems (ISCAS): From Dreams to Innovation, ISCAS 2017 - Conference Proceedings [8050601] Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISCAS.2017.8050601