Immunity analysis of an LDO using identification of operating region transitions

Lammert Duipmans, Dusan Milosevic, Arnoud van der Wel, Ravi Karadi, Peter Baltus

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.

LanguageEnglish
Title of host publication2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages701-706
Number of pages6
ISBN (Electronic)9781509059973
DOIs
StatePublished - 22 Jun 2018
Event60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore
Duration: 14 May 201818 May 2018

Conference

Conference60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
CountrySingapore
CitySuntec City
Period14/05/1818/05/18

Fingerprint

dropouts
immunity
Networks (circuits)
electromagnetic interference
causes
regulators
Signal interference
simulators
simulation
Simulators
direct current
chips
interference
requirements
propagation
shift

Keywords

  • Direct Power Injection (DPI)
  • Electromagnetic Compatibility (EMC)
  • EMI
  • LDO
  • Operating region transition
  • Small-signal model
  • Strongly nonlinear behavior

Cite this

Duipmans, L., Milosevic, D., van der Wel, A., Karadi, R., & Baltus, P. (2018). Immunity analysis of an LDO using identification of operating region transitions. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 (pp. 701-706). Piscataway: Institute of Electrical and Electronics Engineers. DOI: 10.1109/ISEMC.2018.8393872
Duipmans, Lammert ; Milosevic, Dusan ; van der Wel, Arnoud ; Karadi, Ravi ; Baltus, Peter. / Immunity analysis of an LDO using identification of operating region transitions. 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Piscataway : Institute of Electrical and Electronics Engineers, 2018. pp. 701-706
@inproceedings{a599966866824acf870ee2adcc208702,
title = "Immunity analysis of an LDO using identification of operating region transitions",
abstract = "DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.",
keywords = "Direct Power Injection (DPI), Electromagnetic Compatibility (EMC), EMI, LDO, Operating region transition, Small-signal model, Strongly nonlinear behavior",
author = "Lammert Duipmans and Dusan Milosevic and {van der Wel}, Arnoud and Ravi Karadi and Peter Baltus",
year = "2018",
month = "6",
day = "22",
doi = "10.1109/ISEMC.2018.8393872",
language = "English",
pages = "701--706",
booktitle = "2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",

}

Duipmans, L, Milosevic, D, van der Wel, A, Karadi, R & Baltus, P 2018, Immunity analysis of an LDO using identification of operating region transitions. in 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Institute of Electrical and Electronics Engineers, Piscataway, pp. 701-706, 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018, Suntec City, Singapore, 14/05/18. DOI: 10.1109/ISEMC.2018.8393872

Immunity analysis of an LDO using identification of operating region transitions. / Duipmans, Lammert; Milosevic, Dusan; van der Wel, Arnoud; Karadi, Ravi; Baltus, Peter.

2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Piscataway : Institute of Electrical and Electronics Engineers, 2018. p. 701-706.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Immunity analysis of an LDO using identification of operating region transitions

AU - Duipmans,Lammert

AU - Milosevic,Dusan

AU - van der Wel,Arnoud

AU - Karadi,Ravi

AU - Baltus,Peter

PY - 2018/6/22

Y1 - 2018/6/22

N2 - DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.

AB - DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.

KW - Direct Power Injection (DPI)

KW - Electromagnetic Compatibility (EMC)

KW - EMI

KW - LDO

KW - Operating region transition

KW - Small-signal model

KW - Strongly nonlinear behavior

UR - http://www.scopus.com/inward/record.url?scp=85050072227&partnerID=8YFLogxK

U2 - 10.1109/ISEMC.2018.8393872

DO - 10.1109/ISEMC.2018.8393872

M3 - Conference contribution

SP - 701

EP - 706

BT - 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

ER -

Duipmans L, Milosevic D, van der Wel A, Karadi R, Baltus P. Immunity analysis of an LDO using identification of operating region transitions. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018. Piscataway: Institute of Electrical and Electronics Engineers. 2018. p. 701-706. Available from, DOI: 10.1109/ISEMC.2018.8393872