Immunity analysis of an LDO using identification of operating region transitions

Lammert Duipmans, Dusan Milosevic, Arnoud van der Wel, Ravi Karadi, Peter Baltus

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Abstract

DC operating point shifts due to Electromagnetic Interference (EMI) are a major cause of EM immunity failures. Accurate analysis of such nonlinear effects demands the use of time-consuming simulations that are not practical for large-scale circuits. A method is presented that points to the causes of immunity failures by identifying devices that show strongly nonlinear behavior as a result of operating region transitions. It does this without using time-consuming simulations. To further relax the requirements on computational power of the simulator, the method splits the circuit into smaller sub-circuits that are each characterized by small-signal linear models. Using these models, interference propagation through the chip can be estimated. A tool based on the proposed method is implemented and applied to a large-scale test circuit of a Low-Dropout (LDO) regulator.

Original languageEnglish
Title of host publication2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages701-706
Number of pages6
ISBN (Electronic)9781509059973
DOIs
Publication statusPublished - 22 Jun 2018
Event60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapore
Duration: 14 May 201818 May 2018

Conference

Conference60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
CountrySingapore
CitySuntec City
Period14/05/1818/05/18

Keywords

  • Direct Power Injection (DPI)
  • Electromagnetic Compatibility (EMC)
  • EMI
  • LDO
  • Operating region transition
  • Small-signal model
  • Strongly nonlinear behavior

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  • Cite this

    Duipmans, L., Milosevic, D., van der Wel, A., Karadi, R., & Baltus, P. (2018). Immunity analysis of an LDO using identification of operating region transitions. In 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 (pp. 701-706). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ISEMC.2018.8393872