TY - JOUR
T1 - Imaging of a suspended helium film with 2-D electrons by interferometry
AU - Valkering, A.M.C.
AU - Klier, J.
AU - Teske, E.
AU - Heijden, van der, R.W.
AU - Leiderer, P.
PY - 1998
Y1 - 1998
N2 - A helium film suspended between elevations on a substrate forms an excellent surface for a two-dimensional electron gas. With the structure on the substrate a quasi one-dimensional electron system can be created. Experiments probing the electrical transport properties of this system have raised questions about the suspended helium film itself. We report measurements of the suspended film using interferometry. The profile is mapped out as a function of the bulk helium level beneath the substrate. By measuring the electron signal simultaneously the relation between the signal and the film profile can be obtained.
AB - A helium film suspended between elevations on a substrate forms an excellent surface for a two-dimensional electron gas. With the structure on the substrate a quasi one-dimensional electron system can be created. Experiments probing the electrical transport properties of this system have raised questions about the suspended helium film itself. We report measurements of the suspended film using interferometry. The profile is mapped out as a function of the bulk helium level beneath the substrate. By measuring the electron signal simultaneously the relation between the signal and the film profile can be obtained.
U2 - 10.1023/A:1022537308297
DO - 10.1023/A:1022537308297
M3 - Article
VL - 113
SP - 1115
EP - 1120
JO - Journal of Low Temperature Physics
JF - Journal of Low Temperature Physics
SN - 0022-2291
IS - 5-6
ER -