Imaging at high beam energies in the scanning electron microscope

L.M. Gignac, S.H. Boettcher, A.A. Bol, O.C. Wells, M. Kawasaki

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)1444-1445
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
Publication statusPublished - 1 Aug 2006
Externally publishedYes

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