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Image reconstruction of an electrical capacitance tomography system using an artificial neural network

  • T.D. Sun
  • , R.F. Mudde
  • , J.C. Schouten
  • , B. Scarlett
  • , C.M. Bleek, van den

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageEnglish
    Title of host publicationFirst World Congress on Industrial Process Tomography, Buxton, Greater Manchester, April 14-17, 1999
    Pages174-180
    Publication statusPublished - 1999

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