IEEE Std 1500 enables modular SoC testing

E.J. Marinissen; Y. Zorian

doi:10.1109/MDT.2009.12

IEEE Std 1500 enables modular SoC testing

E.J. Marinissen
, Y. Zorian

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.

Original language	English
Pages (from-to)	8-16
Journal	IEEE Design and Test of Computers
Volume	26
Issue number	1
DOIs	https://doi.org/10.1109/MDT.2009.12
Publication status	Published - Jan 2009
Externally published	Yes

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@article{1c7e3aa3fadf4aacbee151f51fab2e74,

title = "IEEE Std 1500 enables modular SoC testing",

abstract = "IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.",

author = "E.J. Marinissen and Y. Zorian",

year = "2009",

month = jan,

doi = "10.1109/MDT.2009.12",

language = "English",

volume = "26",

pages = "8--16",

journal = "IEEE Design and Test of Computers",

issn = "0740-7475",

publisher = "IEEE Computer Society",

number = "1",

}

TY - JOUR

T1 - IEEE Std 1500 enables modular SoC testing

AU - Marinissen, E.J.

AU - Zorian, Y.

PY - 2009/1

Y1 - 2009/1

N2 - IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.

AB - IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.

U2 - 10.1109/MDT.2009.12

DO - 10.1109/MDT.2009.12

M3 - Article

SN - 0740-7475

VL - 26

SP - 8

EP - 16

JO - IEEE Design and Test of Computers

JF - IEEE Design and Test of Computers

IS - 1

ER -

IEEE Std 1500 enables modular SoC testing

Abstract

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