IEEE Std 1500 enables modular SoC testing

E.J. Marinissen, Y. Zorian

Research output: Contribution to journalArticleAcademicpeer-review

Abstract

IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.
Original languageEnglish
Pages (from-to)8-16
JournalIEEE Design and Test of Computers
Volume26
Issue number1
DOIs
Publication statusPublished - Jan 2009
Externally publishedYes

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