IEEE Std 1500 enables modular SoC testing

E.J. Marinissen; Y. Zorian

doi:10.1109/MDT.2009.12

IEEE Std 1500 enables modular SoC testing

Research output: Contribution to journal › Article › Academic › peer-review

Abstract

IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.

Original language	English
Pages (from-to)	8-16
Journal	IEEE Design and Test of Computers
Volume	26
Issue number	1
DOIs	https://doi.org/10.1109/MDT.2009.12
Publication status	Published - Jan 2009
Externally published	Yes

Access to Document

10.1109/MDT.2009.12

Cite this

Marinissen, E. J., & Zorian, Y. (2009). IEEE Std 1500 enables modular SoC testing. IEEE Design and Test of Computers, 26(1), 8-16. https://doi.org/10.1109/MDT.2009.12

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