Abstract
IEEE Std 1500 enables modular SoC testing, not only for core-based testing, but also for divide-and-conquer test generation and test reuse. This article provides a brief tutorial on the standard and illustrates its usage through two application case studies.
Original language | English |
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Pages (from-to) | 8-16 |
Journal | IEEE Design and Test of Computers |
Volume | 26 |
Issue number | 1 |
DOIs | |
Publication status | Published - Jan 2009 |
Externally published | Yes |