IEEE Std 1500 compliant infrastructure for modular SOC testing

T.F. Waayers, E.J. Marinissen, M. Lousberg

Research output: Chapter in Book/Report/Conference proceedingChapterAcademicpeer-review

4 Citations (Scopus)

Abstract

Modern semiconductor process technologies enable the manufacturing of a complete system on one single die, the so-called system-on-chip or SOC. Building those chips in a timely and cost-effective manner is amongst others realized by embedding third-party IP cores. Due to imperfections in silicon manufacturing, an SOC including all its embedded modules needs to be tested for manufacturing defects.
Original languageEnglish
Title of host publication14th Asian Test Symposium (ATS'05)
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages450-450
ISBN (Print)0-7695-2481-8
DOIs
Publication statusPublished - 2005
Externally publishedYes
Event14th Asian Test Symposium (ATS 2005) - Calcutta, India
Duration: 18 Dec 200521 Dec 2005
Conference number: 14

Conference

Conference14th Asian Test Symposium (ATS 2005)
Abbreviated titleATS 2005
CountryIndia
CityCalcutta
Period18/12/0521/12/05

Cite this