Identifying EMC-critical devices by monitoring and classifying operating region transitions

L.J. Duipmans; D. Milosevic; A. Van Der Wel; P.G.M. Baltus

doi:10.1109/EMCCompo.2017.7998073

Identifying EMC-critical devices by monitoring and classifying operating region transitions

L.J. Duipmans, D. Milosevic, A. Van Der Wel, P.G.M. Baltus

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

3 Citations (Scopus)

1 Downloads (Pure)

Abstract

In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

Original language	English
Title of host publication	Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	9-14
Number of pages	6
ISBN (Electronic)	978-1-5386-2689-4
ISBN (Print)	978-1-5386-2690-0
DOIs	https://doi.org/10.1109/EMCCompo.2017.7998073
Publication status	Published - 31 Jul 2017
Event	11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017) - St. Petersburg, Russian Federation Duration: 4 Jul 2017 → 8 Jul 2017 https://emccompo2017.eltech.ru/

Conference

Conference	11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017)
Country/Territory	Russian Federation
City	St. Petersburg
Period	4/07/17 → 8/07/17
Internet address	https://emccompo2017.eltech.ru/

Keywords

Direct Power Injection (DPI)
EMC
EMI
immunity
level shifter
strongly nonlinear behavior

Access to Document

10.1109/EMCCompo.2017.7998073

Cite this

Duipmans, L. J., Milosevic, D., Van Der Wel, A., & Baltus, P. G. M. (2017). Identifying EMC-critical devices by monitoring and classifying operating region transitions. In Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia (pp. 9-14). Article 7998073 Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCCompo.2017.7998073

Duipmans, L.J. ; Milosevic, D. ; Van Der Wel, A. et al. / Identifying EMC-critical devices by monitoring and classifying operating region transitions. Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway : Institute of Electrical and Electronics Engineers, 2017. pp. 9-14

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abstract = "In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.",

keywords = "Direct Power Injection (DPI), EMC, EMI, immunity, level shifter, strongly nonlinear behavior",

author = "L.J. Duipmans and D. Milosevic and {Van Der Wel}, A. and P.G.M. Baltus",

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Duipmans, LJ, Milosevic, D, Van Der Wel, A & Baltus, PGM 2017, Identifying EMC-critical devices by monitoring and classifying operating region transitions. in Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia., 7998073, Institute of Electrical and Electronics Engineers, Piscataway, pp. 9-14, 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), St. Petersburg, Russian Federation, 4/07/17. https://doi.org/10.1109/EMCCompo.2017.7998073

Identifying EMC-critical devices by monitoring and classifying operating region transitions. / Duipmans, L.J.; Milosevic, D.; Van Der Wel, A. et al.
Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway: Institute of Electrical and Electronics Engineers, 2017. p. 9-14 7998073.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Milosevic, D.

AU - Van Der Wel, A.

AU - Baltus, P.G.M.

PY - 2017/7/31

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N2 - In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

AB - In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

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ER -

Duipmans LJ, Milosevic D, Van Der Wel A, Baltus PGM. Identifying EMC-critical devices by monitoring and classifying operating region transitions. In Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway: Institute of Electrical and Electronics Engineers. 2017. p. 9-14. 7998073 doi: 10.1109/EMCCompo.2017.7998073

Identifying EMC-critical devices by monitoring and classifying operating region transitions

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