Identifying EMC-critical devices by monitoring and classifying operating region transitions

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Abstract

In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

Original languageEnglish
Title of host publicationProceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages9-14
Number of pages6
ISBN (Electronic)978-1-5386-2689-4
ISBN (Print)978-1-5386-2690-0
DOIs
Publication statusPublished - 31 Jul 2017
Event11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017) - St. Petersburg, Russian Federation
Duration: 4 Jul 20178 Jul 2017
https://emccompo2017.eltech.ru/

Conference

Conference11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017)
CountryRussian Federation
CitySt. Petersburg
Period4/07/178/07/17
Internet address

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Keywords

  • Direct Power Injection (DPI)
  • EMC
  • EMI
  • immunity
  • level shifter
  • strongly nonlinear behavior

Cite this

Duipmans, L. J., Milosevic, D., Van Der Wel, A., & Baltus, P. G. M. (2017). Identifying EMC-critical devices by monitoring and classifying operating region transitions. In Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia (pp. 9-14). [7998073] Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCCompo.2017.7998073