Identifying EMC-critical devices by monitoring and classifying operating region transitions

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
1 Downloads (Pure)

Abstract

In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

Original languageEnglish
Title of host publicationProceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages9-14
Number of pages6
ISBN (Electronic)978-1-5386-2689-4
ISBN (Print)978-1-5386-2690-0
DOIs
Publication statusPublished - 31 Jul 2017
Event11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017) - St. Petersburg, Russian Federation
Duration: 4 Jul 20178 Jul 2017
https://emccompo2017.eltech.ru/

Conference

Conference11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017)
CountryRussian Federation
CitySt. Petersburg
Period4/07/178/07/17
Internet address

Fingerprint

Electromagnetic compatibility
Networks (circuits)
Monitoring
Signal interference

Keywords

  • Direct Power Injection (DPI)
  • EMC
  • EMI
  • immunity
  • level shifter
  • strongly nonlinear behavior

Cite this

Duipmans, L. J., Milosevic, D., Van Der Wel, A., & Baltus, P. G. M. (2017). Identifying EMC-critical devices by monitoring and classifying operating region transitions. In Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia (pp. 9-14). [7998073] Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/EMCCompo.2017.7998073
Duipmans, L.J. ; Milosevic, D. ; Van Der Wel, A. ; Baltus, P.G.M. / Identifying EMC-critical devices by monitoring and classifying operating region transitions. Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway : Institute of Electrical and Electronics Engineers, 2017. pp. 9-14
@inproceedings{60102a9236004a1f97d9d188cdab1114,
title = "Identifying EMC-critical devices by monitoring and classifying operating region transitions",
abstract = "In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.",
keywords = "Direct Power Injection (DPI), EMC, EMI, immunity, level shifter, strongly nonlinear behavior",
author = "L.J. Duipmans and D. Milosevic and {Van Der Wel}, A. and P.G.M. Baltus",
year = "2017",
month = "7",
day = "31",
doi = "10.1109/EMCCompo.2017.7998073",
language = "English",
isbn = "978-1-5386-2690-0",
pages = "9--14",
booktitle = "Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia",
publisher = "Institute of Electrical and Electronics Engineers",
address = "United States",

}

Duipmans, LJ, Milosevic, D, Van Der Wel, A & Baltus, PGM 2017, Identifying EMC-critical devices by monitoring and classifying operating region transitions. in Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia., 7998073, Institute of Electrical and Electronics Engineers, Piscataway, pp. 9-14, 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2017), St. Petersburg, Russian Federation, 4/07/17. https://doi.org/10.1109/EMCCompo.2017.7998073

Identifying EMC-critical devices by monitoring and classifying operating region transitions. / Duipmans, L.J.; Milosevic, D.; Van Der Wel, A.; Baltus, P.G.M.

Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway : Institute of Electrical and Electronics Engineers, 2017. p. 9-14 7998073.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

TY - GEN

T1 - Identifying EMC-critical devices by monitoring and classifying operating region transitions

AU - Duipmans, L.J.

AU - Milosevic, D.

AU - Van Der Wel, A.

AU - Baltus, P.G.M.

PY - 2017/7/31

Y1 - 2017/7/31

N2 - In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

AB - In many nonlinear circuits, DC operating points may shift when the circuit is subjected to Electromagnetic Interference (EMI), leading to Electromagnetic Compatibility (EMC) failures. Analysis of such failures is classically done using a transient simulation of the whole circuit. For large circuits, this method is not practical due to computational limitations. This paper proposes a computationally inexpensive method that is able to analyze very large-scale circuits and to identify the devices that suffer from strongly nonlinear behavior in the presence of EMI. It does so by checking which devices suffer from operating region transitions. Next, it classifies these transitions to prioritize the devices in terms of their contribution to the EMI problem. The method is demonstrated to work well on a level shifter circuit, a representative case that is widely used in commercial products.

KW - Direct Power Injection (DPI)

KW - EMC

KW - EMI

KW - immunity

KW - level shifter

KW - strongly nonlinear behavior

UR - http://www.scopus.com/inward/record.url?scp=85028517980&partnerID=8YFLogxK

U2 - 10.1109/EMCCompo.2017.7998073

DO - 10.1109/EMCCompo.2017.7998073

M3 - Conference contribution

AN - SCOPUS:85028517980

SN - 978-1-5386-2690-0

SP - 9

EP - 14

BT - Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

ER -

Duipmans LJ, Milosevic D, Van Der Wel A, Baltus PGM. Identifying EMC-critical devices by monitoring and classifying operating region transitions. In Proceedings of the 2017 11th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMCCompo 2017, 4-8 July 2017, St. Petersburg, Russia. Piscataway: Institute of Electrical and Electronics Engineers. 2017. p. 9-14. 7998073 https://doi.org/10.1109/EMCCompo.2017.7998073