Identifying bottlenecks in manufacturing systems using stochastic criticality analysis

J.P. Nogueira Bastos, L.J. van der Sanden, O. Donk, J.P.M. Voeten, S. Stuijk, R.R.H. Schiffelers, H. Corporaal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)
1 Downloads (Pure)

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Computer Science