Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process

S.K. Wattamwar, S. Weiland, A.C.P.M. Backx

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

5 Citations (Scopus)

189 Downloads (Pure)

Original language	English
Title of host publication	Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
ISBN (Print)	978-1-4244-2222-7
DOIs	https://doi.org/10.1109/CCA.2008.4629689
Publication status	Published - 2008

Access to Document

Wattamwar, S. K., Weiland, S., & Backx, A. C. P. M. (2008). Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process. In Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/CCA.2008.4629689

Wattamwar, S.K. ; Weiland, S. ; Backx, A.C.P.M. / Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process. Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA. Piscataway : Institute of Electrical and Electronics Engineers, 2008.

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Wattamwar, SK, Weiland, S & Backx, ACPM 2008, Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process. in Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA. Institute of Electrical and Electronics Engineers, Piscataway. https://doi.org/10.1109/CCA.2008.4629689

Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process. / Wattamwar, S.K.; Weiland, S.; Backx, A.C.P.M.
Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA. Piscataway: Institute of Electrical and Electronics Engineers, 2008.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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T1 - Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process

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AU - Weiland, S.

AU - Backx, A.C.P.M.

PY - 2008

Y1 - 2008

U2 - 10.1109/CCA.2008.4629689

DO - 10.1109/CCA.2008.4629689

M3 - Conference contribution

SN - 978-1-4244-2222-7

BT - Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

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Wattamwar SK, Weiland S, Backx ACPM. Identification of Low Dimensional Models for slow Geometric Parameter Variation in an Industrial Glass Manufacturing Process. In Control Applications, 2008. CCA 2008. 17th IEEE International Conference on applications, 3-5-09-2008, San Antonio, Texas USA. Piscataway: Institute of Electrical and Electronics Engineers. 2008 doi: 10.1109/CCA.2008.4629689