Abstract
The hydrogen and silicon density of a-Si:H-films deposited by an expanding thermal plasma have been investigated for a wide range of substrate temperatures and growth rates by infrared absorption spectroscopy in combination with elastic recoil detection and Rutherford backscattering. The study reveals that, despite the increasing atomic hydrogen interaction and high substrate temperatures, the a-Si:H remains purely amorphous at low growth rates as concluded from Raman spectroscopy. Additionally, the infrared spectroscopy proportionality constants of the silicon-hydrogen and silicon-deuterium bondings have been recalibrated.
Original language | English |
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Title of host publication | Amorphous and microcrystalline silicon technology - 1998 : symposium held April 14 - 17, 1998, San Francisco, California, U.S.A. |
Editors | R. Schropp |
Pages | 529-534 |
Number of pages | 6 |
Publication status | Published - 1998 |
Event | 1998 MRS Spring Meeting & Exhibit - San Francisco, United States Duration: 13 Apr 1998 → 17 Apr 1998 https://www.mrs.org/spring1998 |
Publication series
Name | Materials Research Society Symposium Proceedings |
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Volume | 507 |
ISSN (Print) | 0272-9172 |
Conference
Conference | 1998 MRS Spring Meeting & Exhibit |
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Country/Territory | United States |
City | San Francisco |
Period | 13/04/98 → 17/04/98 |
Other | Symposium held at the 1998 MRS Spring Meeting |
Internet address |