Hydrogen in a-Si:H deposited by an expanding thermal plasma : a temperature, growth rate and isotope study

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Abstract

The hydrogen and silicon density of a-Si:H-films deposited by an expanding thermal plasma have been investigated for a wide range of substrate temperatures and growth rates by infrared absorption spectroscopy in combination with elastic recoil detection and Rutherford backscattering. The study reveals that, despite the increasing atomic hydrogen interaction and high substrate temperatures, the a-Si:H remains purely amorphous at low growth rates as concluded from Raman spectroscopy. Additionally, the infrared spectroscopy proportionality constants of the silicon-hydrogen and silicon-deuterium bondings have been recalibrated.

Original languageEnglish
Title of host publicationAmorphous and microcrystalline silicon technology - 1998 : symposium held April 14 - 17, 1998, San Francisco, California, U.S.A.
EditorsR. Schropp
Pages529-534
Number of pages6
Publication statusPublished - 1998
Event1998 MRS Spring Meeting & Exhibit - San Francisco, United States
Duration: 13 Apr 199817 Apr 1998
https://www.mrs.org/spring1998

Publication series

NameMaterials Research Society Symposium Proceedings
Volume507
ISSN (Print)0272-9172

Conference

Conference1998 MRS Spring Meeting & Exhibit
Country/TerritoryUnited States
CitySan Francisco
Period13/04/9817/04/98
OtherSymposium held at the 1998 MRS Spring Meeting
Internet address

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