Abstract
We present a novel approach to design compact, single mode, hybrid 111-V/silicon microlasers. At both ends of the 111-V laser cavity, silicon gratings are operated in a resonant regime to allow high reflection over a short distance. We have verified this technique numerically andfound that, for a thick bonding layer of350 nm, more than 93% reflection can be obtained over a distance of less than 20 pm.
| Original language | English |
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| Title of host publication | Proceedings of the 15th Annual Symposium of the IEEE Photonics Benelux Chapter, 18-19 November 2010, Delft, The Netherlands |
| Editors | J. Pozo, M. Mortensen, P. Urbach, X. Leijtens, M. Yousefi |
| Place of Publication | Delft |
| Publisher | TNO |
| Pages | 173-176 |
| ISBN (Print) | 978-90-78314-15-8 |
| Publication status | Published - 2010 |