Higher-order statistics for stochastic electromagnetic interactions: applications to a thin-wire frame

O.O Sy, M.C. Beurden, van, B.L. Michielsen, J.A.H.M. Vaessen, A.G. Tijhuis

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
77 Downloads (Pure)

Abstract

Uncertainties in an electromagnetic observable, that arise from uncertainties in geometric and electromagnetic parameters of an interaction configuration, are here characterized by combining computable higher-order moments of the observable with higher-order Chebychev inequalities. This allows for the estimation of the range of the observable by rigorous confidence intervals. The estimated range is then combined with the maximum-entropy principle to arrive at an efficient and reliable estimation of the probability density function of the observable. The procedure is demonstrated for the case of the induced voltage of a thin-wire frame that has a random geometry, is connected to a random load, and is illuminated by a random incident field.
Original languageEnglish
Pages (from-to)307-332
Number of pages26
JournalProgress In Electromagnetics Research B
Volume41
DOIs
Publication statusPublished - 2012

Fingerprint Dive into the research topics of 'Higher-order statistics for stochastic electromagnetic interactions: applications to a thin-wire frame'. Together they form a unique fingerprint.

  • Cite this