Abstract
Al2O3 thin films deposited at rates as high as 1.2 nm s-1 using spatially separated atomic layer deposition show excellent solar cell surface passivation properties, i.e., recombination velocities of
Original language | English |
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Pages (from-to) | 3564-3567 |
Journal | Advanced Materials |
Volume | 22 |
Issue number | 32 |
DOIs | |
Publication status | Published - 2010 |