High resolution x-ray diffraction and reflectivity studies of short period CdTe/MnTe-superlattices

J. Stangl, A.A. Darhuber, V. Holy, M. Naurois, de, S.O Ferreira, W. Faschinger, G. Bauer

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)


CdTe/MnTe superlattices have recently been focused on because of their magnetic properties, in particular, the magnetic coupling of the MnTe layers across the CdTe interlayers. The aim of the present paper is the determination of the structural parameters of short-period CdTe/MnTe superlattice samples by means of X-ray diffraction and X-ray reflectivity studies, as these parameters are essential for the interpretation of the experiments on the magnetic properties. Using X-ray diffraction, we obtained the layer structure and the strain status of the superlattices. From X-ray reflectivity, information on the interface morphology and the replication of the interface structure during the growth of the superlattices is obtained.
Original languageEnglish
Pages (from-to)105-108
Number of pages4
JournalJournal of Crystal Growth
Publication statusPublished - 1998

Fingerprint Dive into the research topics of 'High resolution x-ray diffraction and reflectivity studies of short period CdTe/MnTe-superlattices'. Together they form a unique fingerprint.

  • Cite this