High-resolution transmission electron microscopy of misfit-dislocations at metaloxide interfaces

H.B. Groen, B.J. Kooi, W.P. Vellinga, J.Th.M. Hosson, de

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationIntergranular and Interphase Boundaries in Materials
PublisherTrans Tech Publications
Pages107-110
DOIs
Publication statusPublished - 1999

Publication series

NameMaterials Science Forum
Volume294-296
ISSN (Print)0255-5476

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