High-resolution tip-enhanced Raman mapping

G.G. Hoffmann, L. Xue, J. Loos, G. With, de

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8 Citations (Scopus)

Abstract

Tip-enhanced Raman mapping (TERM) can be used to obtain chemical analysis of a sample with a topographical resolution down to 15¿nm. A short review of this technique is given. Among other samples (e.g. carbon nanotubes and graphene), we recently measured a high resolution tip-enhanced Raman map of a polymer for the first time. Using TERM, the phase separation behaviour of a polymer blend (PMMA/SAN) was monitored. In the early, incomplete state of phase separation an interface width of ~200¿nm was measured. A spatial resolution in the tens of nm range could be achieved.
Original languageEnglish
Pages (from-to)26-42
Number of pages17
JournalMacromolecular Symposia
Volume305
Issue number1
DOIs
Publication statusPublished - 2011

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