High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index

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Abstract

We present a high-resolution optical frequency domain reflectometry for characterization of group refractive index of waveguides in photonic integrated circuits. The method provides a relative accuracy of 10-4 for group refractive index measurements and of 10-3 for its dispersion.
Original languageEnglish
Title of host publication2017 IEEE Photonics Conference (IPC), 1-5 October 2017, Orlando, Florida
Place of PublicationPiscataway
PublisherInstitute of Electrical and Electronics Engineers
Pages537-538
Number of pages2
ISBN (Electronic)978-1-5090-6578-3
ISBN (Print)978-1-5090-6579-0
DOIs
Publication statusPublished - 20 Nov 2017
Event30th Annual Conference of the IEEE Photonics Society (IPC 2017) - Lake Buena Vista, United States
Duration: 1 Oct 20175 Oct 2017
Conference number: 30
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=8115973

Conference

Conference30th Annual Conference of the IEEE Photonics Society (IPC 2017)
Abbreviated titleIPC 2017
CountryUnited States
CityLake Buena Vista
Period1/10/175/10/17
Internet address

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Cite this

Zhao, D., Pustakhod, D., Williams, K. A., & Leijtens, X. J. M. (2017). High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index. In 2017 IEEE Photonics Conference (IPC), 1-5 October 2017, Orlando, Florida (pp. 537-538). Piscataway: Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IPCon.2017.8116212