High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index

D. Zhao; D. Pustakhod; K.A. Williams; X.J.M. Leijtens

doi:10.1109/IPCon.2017.8116212

High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index

D. Zhao, D. Pustakhod, K.A. Williams, X.J.M. Leijtens

Photonic Integration

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

1 Citation (Scopus)

188 Downloads (Pure)

Abstract

We present a high-resolution optical frequency domain reflectometry for characterization of group refractive index of waveguides in photonic integrated circuits. The method provides a relative accuracy of 10-4 for group refractive index measurements and of 10-3 for its dispersion.

Original language	English
Title of host publication	2017 IEEE Photonics Conference (IPC), 1-5 October 2017, Orlando, Florida
Place of Publication	Piscataway
Publisher	Institute of Electrical and Electronics Engineers
Pages	537-538
Number of pages	2
ISBN (Electronic)	978-1-5090-6578-3
ISBN (Print)	978-1-5090-6579-0
DOIs	https://doi.org/10.1109/IPCon.2017.8116212
Publication status	Published - 20 Nov 2017
Event	30th IEEE Photonics Conference, IPC 2017 - Lake Buena Vista, United States Duration: 1 Oct 2017 → 5 Oct 2017 Conference number: 30 https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=8115973

Conference

Conference	30th IEEE Photonics Conference, IPC 2017
Abbreviated title	IPC 2017
Country/Territory	United States
City	Lake Buena Vista
Period	1/10/17 → 5/10/17
Internet address	https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=8115973

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10.1109/IPCon.2017.8116212

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title = "High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index",

abstract = "We present a high-resolution optical frequency domain reflectometry for characterization of group refractive index of waveguides in photonic integrated circuits. The method provides a relative accuracy of 10-4 for group refractive index measurements and of 10-3 for its dispersion.",

author = "D. Zhao and D. Pustakhod and K.A. Williams and X.J.M. Leijtens",

year = "2017",

month = nov,

day = "20",

doi = "10.1109/IPCon.2017.8116212",

language = "English",

isbn = "978-1-5090-6579-0 ",

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booktitle = "2017 IEEE Photonics Conference (IPC), 1-5 October 2017, Orlando, Florida",

publisher = "Institute of Electrical and Electronics Engineers",

address = "United States",

note = "30th IEEE Photonics Conference, IPC 2017, IPC 2017 ; Conference date: 01-10-2017 Through 05-10-2017",

url = "https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=8115973",

}

Zhao, D, Pustakhod, D , Williams, KA & Leijtens, XJM 2017, High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index. in 2017 IEEE Photonics Conference (IPC), 1-5 October 2017, Orlando, Florida. Institute of Electrical and Electronics Engineers, Piscataway, pp. 537-538, 30th IEEE Photonics Conference, IPC 2017, Lake Buena Vista, Florida, United States, 1/10/17. https://doi.org/10.1109/IPCon.2017.8116212

High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index. / Zhao, D.; Pustakhod, D.; Williams, K.A. et al.
2017 IEEE Photonics Conference (IPC), 1-5 October 2017, Orlando, Florida. Piscataway: Institute of Electrical and Electronics Engineers, 2017. p. 537-538.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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AU - Pustakhod, D.

AU - Williams, K.A.

AU - Leijtens, X.J.M.

N1 - Conference code: 30

PY - 2017/11/20

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N2 - We present a high-resolution optical frequency domain reflectometry for characterization of group refractive index of waveguides in photonic integrated circuits. The method provides a relative accuracy of 10-4 for group refractive index measurements and of 10-3 for its dispersion.

AB - We present a high-resolution optical frequency domain reflectometry for characterization of group refractive index of waveguides in photonic integrated circuits. The method provides a relative accuracy of 10-4 for group refractive index measurements and of 10-3 for its dispersion.

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DO - 10.1109/IPCon.2017.8116212

M3 - Conference contribution

SN - 978-1-5090-6579-0

SP - 537

EP - 538

BT - 2017 IEEE Photonics Conference (IPC), 1-5 October 2017, Orlando, Florida

PB - Institute of Electrical and Electronics Engineers

CY - Piscataway

T2 - 30th IEEE Photonics Conference, IPC 2017

Y2 - 1 October 2017 through 5 October 2017

ER -

High resolution optical frequency domain reflectometry for measurement of waveguide group refractive index

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