High-Resolution AWG-based fiber bragg grating interrogator

D. Pustakhod; E. Kleijn; K. Williams; X. Leijtens

doi:10.1109/LPT.2016.2587812

High-Resolution AWG-based fiber bragg grating interrogator

D. Pustakhod, E. Kleijn, K. Williams, X. Leijtens

Research output: Contribution to journal › Letter › Academic › peer-review

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Abstract

A novel InP-based monolithically integrated multiwavelength detector is used as the central part of a fiber Bragg grating interrogator unit. We have designed the arrayed waveguide grating (AWG) in the device such that at least two detectors have a significant signal at any wavelength being measured. Consequently, the measurement resolution is increased, while keeping the area of device small. We demonstrate the resolution of the measurement to be 0.32 pm over a working range of 10 nm. The corresponding relative resolution of 0.003% is to our knowledge the best reported to date in an integrated interrogator.

Original language	English
Pages (from-to)	2203-2206
Number of pages	4
Journal	IEEE Photonics Technology Letters
Volume	28
Issue number	20
DOIs	https://doi.org/10.1109/LPT.2016.2587812
Publication status	Published - 15 Oct 2016

Keywords

Arrayed waveguide gratings
Bragg gratings
Detectors
Passband
Signal resolution
Temperature measurement
Wavelength measurement
Photonic integrated circuits
fiber Bragg grating
optical waveguide filters

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title = "High-Resolution AWG-based fiber bragg grating interrogator",

abstract = "A novel InP-based monolithically integrated multiwavelength detector is used as the central part of a fiber Bragg grating interrogator unit. We have designed the arrayed waveguide grating (AWG) in the device such that at least two detectors have a significant signal at any wavelength being measured. Consequently, the measurement resolution is increased, while keeping the area of device small. We demonstrate the resolution of the measurement to be 0.32 pm over a working range of 10 nm. The corresponding relative resolution of 0.003% is to our knowledge the best reported to date in an integrated interrogator.",

keywords = "Arrayed waveguide gratings, Bragg gratings, Detectors, Passband, Signal resolution, Temperature measurement, Wavelength measurement, Photonic integrated circuits, fiber Bragg grating, optical waveguide filters",

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AU - Pustakhod, D.

AU - Kleijn, E.

AU - Williams, K.

AU - Leijtens, X.

PY - 2016/10/15

Y1 - 2016/10/15

N2 - A novel InP-based monolithically integrated multiwavelength detector is used as the central part of a fiber Bragg grating interrogator unit. We have designed the arrayed waveguide grating (AWG) in the device such that at least two detectors have a significant signal at any wavelength being measured. Consequently, the measurement resolution is increased, while keeping the area of device small. We demonstrate the resolution of the measurement to be 0.32 pm over a working range of 10 nm. The corresponding relative resolution of 0.003% is to our knowledge the best reported to date in an integrated interrogator.

AB - A novel InP-based monolithically integrated multiwavelength detector is used as the central part of a fiber Bragg grating interrogator unit. We have designed the arrayed waveguide grating (AWG) in the device such that at least two detectors have a significant signal at any wavelength being measured. Consequently, the measurement resolution is increased, while keeping the area of device small. We demonstrate the resolution of the measurement to be 0.32 pm over a working range of 10 nm. The corresponding relative resolution of 0.003% is to our knowledge the best reported to date in an integrated interrogator.

KW - Arrayed waveguide gratings

KW - Bragg gratings

KW - Detectors

KW - Passband

KW - Signal resolution

KW - Temperature measurement

KW - Wavelength measurement

KW - Photonic integrated circuits

KW - fiber Bragg grating

KW - optical waveguide filters

U2 - 10.1109/LPT.2016.2587812

DO - 10.1109/LPT.2016.2587812

M3 - Letter

VL - 28

SP - 2203

EP - 2206

JO - IEEE Photonics Technology Letters

JF - IEEE Photonics Technology Letters

SN - 1041-1135

IS - 20

ER -